Industry News: halt & hass (Page 1 of 3)

AIMS Harsh Environment Electronics Symposium Call for Abstracts

Industry News | 2010-03-15 11:28:06.0

The SMTA and Auburn University are pleased to announce that the AIMS (Automotive, Industrial, Military and Space) Harsh Environment Electronics Symposium will be held October 25-26, 2010. Dr. John Evans, Conference Chairman and the program technical committee invite you to submit an abstract to participate in this exciting program.

Surface Mount Technology Association (SMTA)

SMTA ANNOUNCES 6^th ANNUAL AIMS HARSH ENVIRONMENT ELECTRONICS WORKSHOP

Industry News | 2008-01-31 14:26:48.0

ORLANDO, FL - The SMTA and Auburn University are pleased to announce that the AIMS (Automotive, Industrial, Military and Space) Harsh Environment Electronics Workshop will be held August 18-19, 2008. The 2008 program will move from Indianapolis to Orlando to co-locate with SMTA International.

Surface Mount Technology Association (SMTA)

SMTA Announces AIMS Harsh Environment Electronics Symposium Call For Papers

Industry News | 2008-12-19 18:59:58.0

Minneapolis, MN � The SMTA and Auburn University are pleased to announce that the AIMS (Automotive, Industrial, Military and Space) Harsh Environment Electronics Symposium will be held October 5-6, 2009. Dr. John Evans, Conference Chairman and the program technical committee invite you to submit an abstract to participate in this exciting program. The symposium will once again focus on harsh environments with an emphasis on military and space.

Surface Mount Technology Association (SMTA)

SMTA Announces AIMS Harsh Environments Symposium Call for Abstracts

Industry News | 2010-02-08 12:28:51.0

Minneapolis, MN - The SMTA and Auburn University are pleased to announce that the AIMS (Automotive, Industrial, Military and Space) Harsh Environment Electronics Symposium will be held October 25-26, 2010. Dr. John Evans, Conference Chairman and the program technical committee invite you to submit an abstract to participate in this exciting program. The symposium will once again focus on harsh environments with an emphasis on military and space.

Surface Mount Technology Association (SMTA)

Learn about PDR’s Rapid Dual Thermal Defect Detection & Component / Solder-Joint Validation at SMTA Wisconsin

Industry News | 2017-04-23 11:18:17.0

PDR, a leader in IR rework, test and inspection, is pleased to announce that Horizon Sales will discuss its new PDR IR-TS Series of micro-focused HALT/HASS thermal test systems at the SMTA Wisconsin Expo & Tech Forum, scheduled to take place Tuesday, May 2, 2017 at the Milwaukee Airport Crowne Plaza in WI. Horizon Sales is PDR’s exclusive representative in the Midwestern U.S.

PDR-America

New Rapid Dual Thermal Defect Detection & Component / Solder-Joint Validation from PDR Americas

Industry News | 2017-02-28 20:41:01.0

PDR is pleased to introduce the new PDR IR-TS Series of micro-focused HALT/HASS thermal test systems. The PDR IR-TS One Bench Top System and TS-2100 Cabinet System have been designed to thermally cycle key critical components and assemblies to detect defects. Applications include testing electronic assemblies, electronic devices, bonded structures of plastics and ceramics in a wide variety of fields, including medical, automotive, avionics, space and defense.

PDR-America

Micro-Focused IR Thermal Testing with PDR's Focused IR

Industry News | 2017-06-20 20:15:03.0

PDR introduces the benchtop based PDR IR-TS One IR Thermal Test System, designed to thermally cycle key critical components and assemblies to detect defects. Using PDR’s unique Non-Destructive Dual Thermal Stress Screening Process, based on a variation on HALT/HASS principles, the system is able to focus the testing on suspected problem areas to safely screen out early field failures caused by design, environmental, production and structural defects.

PDR-America

Random Vibration, Shock Testing, HALT, ESS and HASS Training

Industry News | 2003-04-01 20:08:24.0

April 30 - May 2, 2003 in Mississauga, Canada

Equipment Reliability Institute - ERI

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