Industry News: inspection defects (Page 20 of 123)

New Viscom 3D AOI line-up and 360View feature for improved 3D inspection

Industry News | 2016-07-26 18:48:27.0

Viscom today announced plans to introduce its new 3D AOI line-up to Asian markets, highlighting its new 360View feature in Stand 1F35 at NEPCON South China, scheduled to take place Aug. 30-Sept. 1, 2016 at the Shenzhen Convention & Exhibition Centre.

Viscom AG

Vi TECHNOLOGY to exhibit advanced 3D inspection solutions at NEPCON China

Industry News | 2018-04-16 20:21:58.0

Vi TECHNOLOGY today announced that its products will be showcased at NEPCON China, scheduled to take place April 24-26, 2018 at the Shanghai World EXPO Exhibition & Convention Center.

Vi TECHNOLOGY

Discuss the latest inspection trends with Scienscope at the SMTA Juarez Expo

Industry News | 2023-05-03 09:05:08.0

We are excited to announce that Scienscope International will be exhibiting at the SMTA Juarez Expo & Tech Forum in Chihuahua, Mexico, on Thursday, May 18, 2023. As a prominent supplier of cabinet-style micro-focus X-ray systems in the United States, we are confident that our products are the right solution for your production process.

SCIENSCOPE International

New release of a space-saving compact substrate inspection machine (AOI/SPI) “RV-2”

Industry News | 2015-10-06 19:39:34.0

JUKI released a space-saving compact PWB Inspection Machine "RV-2" at home and abroad in March 18. As a single-lane inspection machine, "RV-2" inherits the high-accuracy inspection capability of the high-end PWB Inspection Machine RV-1. This is an in-line type high-precision PWB inspection machine in space saving compact design.

Juki Automation Systems

MVP will introduce its new Supra inspection system at APEX 2003

Industry News | 2003-02-21 18:48:56.0

Machine Vision Products, Inc. (MVP), global leader in automated optical inspection (AOI) and process control solutions, today has announced that it will introduce its new Supra inspection system at APEX 2003, in Anaheim, California, March 31 through April 2.MVP will introduce its new Supra inspection system at APEX 2003.

Machine Vision Products, Inc

MatriX Technologies introduces its high-speed inline 3D X-ray inspection system at the APEX show 2013 in San Diego

Industry News | 2013-03-12 14:11:50.0

After successfully launching the first X3 In-line X-Ray system in 2011, MatriX Technologies now presented its new X3L system in the USA. As of this year, besides the universal 3D inspection system X3, the X3L configuration is available with an innovative dual detector concept, combining a line-scan for transmission inspection of complete PCBs in a few seconds and a high-resolution digital flatpanel detector for selective 3D image capturing.

MatriX Technologies GmbH

Vi TECHNOLOGY launches the REVEAL Imager AOI Series, a breakthrough inspection solution for the Camera Modules manufacturing industry at SEMICON West 2010, booth 5377

Industry News | 2010-07-09 13:02:47.0

Vi TECHNOLOGY introduces the REVEAL Imager Series, at SEMICON West 2010 from July 13th to 15th, Booth 5377 - North Hall – San Francisco Moscone Center. Along with the product an automatic JEDEC Tray loader compatible with both REVEAL Imager and REVEAL MEMS Series will be demonstrated.

Vi TECHNOLOGY

Viscom presents the most advanced and comprehensive range of high-speed 3D AOI, SPI and AXI inspection systems at Nepcon South China.

Industry News | 2014-07-28 12:42:54.0

Viscom will present the most advanced and comprehensive SPI, AOI and X-ray portfolio on the market in Booth #A-1C36 at Nepcon South China. Viscom S3088 AOI and SPI systems are designed to flexibly cover even the most challenging requirements, from small series production to high-volume/low-mix. The new XM-3D camera module allows for especially fast inspections, with both high-resolution angled views and 3D analyses.

Viscom AG

Viscom presents the most advanced and comprehensive range of high-speed 3D AOI, SPI and AXI inspection systems at Nepcon South China

Industry News | 2014-07-28 21:55:58.0

Viscom announced today that they will present the most advanced and comprehensive SPI, AOI and X-ray portfolio on the market in Booth #A-1C36 at Nepcon South China, scheduled to take place August 26-28, 2014 at the Shenzhen Convention & Exhibition Center in China.

Viscom AG

More BGA Defect Examples Available Royalty FREE

Industry News | 2017-01-05 04:27:37.0

BGA Inspection & Defect Photo Album (Can be downloaded) The photo CD-ROM album featuring over 280 colour images on BGA, materials, inspection and defects and is available to allow engineers to create their own training material, PowerPoint files, process documents, technical articles and standards. The disk includes examples of the following:

ASKbobwillis.com


inspection defects searches for Companies, Equipment, Machines, Suppliers & Information

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