Industry News: jig testing (Page 1 of 3)

Multi-function JTAG Module Addresses Analogue Testing JTAG Technologies launches the JT 2149/DAF I/O module for digital and analogue measurement

Industry News | 2012-06-20 14:00:03.0

JTAG Technologies, has introduced the JT 2149/DAF, a compact, mixed-signal (Digital/Analogue/Frequency) measurement module. The JT 2149/DAF is the first unit of its type to offer both digital and analogue test access to PCBs via JTAG Technologies’ widely-used QuadPod signal conditioning interface.

JTAG Technologies B. V.

Equipment Services LLC introduces new SMT feeder calibration, repair and refurbishment services

Industry News | 2008-12-09 23:51:26.0

Equipment Services LLC introduces new SMT feeder calibration, repair and refurbishment services

Equipment Services LLC

Video Demonstration for HIOKI 1240 Flying Probe Tester with New Software Programming Feature Is Now Live on Seika TV

Industry News | 2013-04-18 11:08:20.0

Seika Machinery, Inc., announces that it has added a video demonstration of the HIOKI 1240 Flying Probe Tester with the new software programming feature to Seika TV.

Seika Machinery, Inc.

Seika Goes to the SMTA Carolinas Expo & Tech Forum

Industry News | 2014-01-09 11:15:15.0

Seika Machinery, Inc. announces that it will attend the SMTA Carolinas Expo & Tech Forum, scheduled to take place Thursday, January 23, 2014 at the Double Tree Raleigh Brownstone – University in Raleigh, NC. Seika will highlight the new HIOKI 1240 Flying Probe Tester and proven McDry Cabinets.

Seika Machinery, Inc.

Seika’s Manufacturer Awarded Prime Minister’s Green Campaign Award

Industry News | 2010-02-08 12:03:17.0

TORRANCE, CA — February 2010 — Seika Machinery, Inc., a leading provider of advanced machinery, materials and engineering services, announces that HIOKI, the manufacturer of Seika’s 1240 Hioki Flying Probe Tester and ICT systems, was nominated as one of the recipients of the 2009 Green Campaign Award of the office of the Japanese Prime Minister.

Seika Machinery, Inc.

Computrol Strengthens Its Functional Test Capabilities with a SPEA 4050 Flying Probe Tester

Industry News | 2016-05-09 20:54:50.0

Computrol today announced that it has purchased and installed a SPEA 4050 Flying Probe Tester. The addition of the SPEA flying probe at Computrol’s Meridian, ID facility further strengthens the company’s extensive functional test capabilities.

Computrol, Inc.

XYZTEC makes lid pull easy

Industry News | 2016-09-30 05:38:43.0

In this newsletter we describe a new method of testing the seal and adhesive quality of a lid encapsulated devices.

XYZTEC bv

Seika Machinery, Inc. Debuts HIOKI’s High-Speed 1240 Series X-Y IN-CIRCUIT HiTESTERs

Industry News | 2011-02-11 13:21:48.0

Seika Machinery, Inc. introduces HIOKI’s X-Y IN-CIRCUIT HiTESTER 1240 Series of high-speed, high-precision, high-reliability populated board flying probe testers that are ideal for high-mix/low-volume production.

Seika Machinery, Inc.

Seika to Promote Its Latest Router and Probe Tester at SMTA Wisconsin

Industry News | 2013-09-13 07:05:50.0

Seika Machinery, Inc.announces that it will highlight the Sayaka SAM-CT23W and HIOKI 1240 at the SMTA Wisconsin/Great Lakes Expo & Tech Forum, scheduled to take place Wednesday, September 18, 2013 at the Crowne Plaza Milwaukee Airport in Wisconsin.

Seika Machinery, Inc.

Seika to Highlight HIOKI and Product Literature at SMTA Houston Expo & Tech Forum

Industry News | 2010-02-08 12:05:06.0

TORRANCE, CA — February 2010 — Seika Machinery, Inc., a leading provider of advanced machinery, materials and engineering services, announces that it will highlight its HIOKI Flying Probe ICT with AOI functions at the upcoming SMTA Houston Expo and Tech Forum, scheduled to take place Thursday, March 4, 2010 at the Stafford Centre in Stafford, TX.

Seika Machinery, Inc.

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