Industry News | 2013-05-14 12:24:08.0
Multitest offers innovative approaches for test strategies of 3D ICs and Sensors – Meet Multitest at ECTC, May 28-30, Las Vegas
Industry News | 2010-02-15 19:32:28.0
Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Valts Treibergs and Chris Cuda will present a paper titled “Spring Probe PCB Pad Wear Analysis” at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/Mesa Hotel in Mesa, Ariz.
Industry News | 2009-08-12 16:36:33.0
POMONA, CA — August 2009 — Multitest, a manufacturer of semiconductor handling equipment, has renewed its licenses for ProWorks for another year. ProWorks has helped Multitest obtain agility and flexibility in these economic times by giving it the ability to quickly adjust its workforce to the environment.
Industry News | 2011-06-07 15:02:59.0
Multitest has received another order for its unique InCarrier® test equipment from a major test house in Asia. The InCarrier® was preferred against standard singulated package test as well as other methods of high parallel test.
Industry News | 2011-08-10 19:56:26.0
Multitest introduces MT9510 x16, a new 16-site tri-temp pick-and-place handler.
Industry News | 2010-10-27 19:51:21.0
Multitest announces that it has been awarded a Global Technology Award in the category of Components for its DURA® Kelvin™.
Industry News | 2011-02-03 14:43:42.0
Multitest announces that Valts Treibergs, R&D Engineering Manager, and Chris Cuda, US Product Manager, will present "PCB Pad Wear Analysis at 0.4 mm Pitch ― the Story Continues…" at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, AZ.
Industry News | 2011-02-09 14:05:35.0
Multitest announces that Ryan Satrom, RF Engineer, and Jason Mroczkowski, RF Engineering and Product Manager, will hold a tutorial titled "Signal and Power Integrity in the Test Interface" at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, AZ.
Industry News | 2011-06-09 14:01:00.0
Multitest announces that its MT2168 is designed for best tester utilization. Short index time (DUT exchange time), fast loading and sorting, and a high soak capacity support the handler to keep pace with the new tester generation.
Industry News | 2012-09-28 09:04:41.0
Multitest announces that Business Unit Manager Günther Jeserer chaired the Docking and Mounting Working Group conducted by the Collaborative Alliance for Semiconductor Test (CAST), which began its activities under the SEMI organization in 2008.
