Industry News | 2013-05-02 10:42:04.0
Multitest, announces that its ecoAmp™ high-power Kelvin contactor successfully passed a challenging evaluation for an automotive application at an European-based IDM.
Industry News | 2013-06-18 14:58:13.0
Multitest, announces that James Quinn will present during the 2013 SEMICON West exhibition & conference, scheduled to take place July 9-11, 2013 at the Moscone Center in San Francisco, CA.
Industry News | 2013-06-25 11:29:47.0
Multitest, announces that Klaus Ruhmer will present at Test Vision 2020, in conjunction with SEMICON West, scheduled to take place July 10-11, 2013 at the San Francisco Marriott Marquis.
Industry News | 2010-08-18 19:35:18.0
Multitest, the market leader for MEMS test and calibration equipment, sees great opportunities for the MEMS industry in Asia. Alex Chen, Taiwanese Regional Manager, recently became a member of the Semi Taiwan MEMS Committee to actively contribute to the success of the Asian MEMS industry.
Industry News | 2012-02-07 16:18:35.0
Multitest announces that Jim Brandes, Product Manager, will hold a presentation titled “Specmanship” at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 4-7, 2012 Mesa, AZ.
Industry News | 2013-09-09 12:42:47.0
LTX-Credence Corporation (Nasdaq:LTXC), announced an important step in the evolution of the semiconductor test cell with an agreement to acquire Multitest and Everett Charles Technologies (ECT) from Dover Corporation (NYSE:DOV).
Industry News | 2010-08-27 22:49:53.0
Multitest announces that its Gemini™ series contactors have been chosen by another major semiconductor IDM as the contactor of choice for QFN packages. Gemini™ outperformed the competition in multiple categories over months of evaluation.
Industry News | 2010-10-14 15:54:00.0
Multitest now offers Test Interface Simulation to optimize test interfaces. Signal Integrity Simulation is valuable in understanding the performance of the test interface.
Industry News | 2012-07-09 08:11:26.0
Multitest announces that the first Multitest Plug & Yield solution for the test of 3D packages recently has been released to the customer’s production.
Industry News | 2013-05-31 13:26:07.0
Multitest,announces that Jason Mroczkowski, Signal Integrity Engineer, will present at the upcoming The IEEE Semiconductor Wafer Test Workshop in San Diego, CA. The presentation entitled, “High Frequency PCB Material Analysis,” is scheduled to take place Wednesday, June 12, 2013 from 10:30-11 a.m.
