Industry News: multitest 2168 handler (Page 13 of 14)

Multitest’s Engineering Experts to Discuss Tri-Temperature Test at BiTS 2011

Industry News | 2011-02-17 14:46:04.0

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Ryan Satrom, RF Engineer, and Paul Hurst, Engineering Manager, will present a paper titled "A Single Source Solution for a 26GHz, Tri-Temperature Test Cell" at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, AZ.

Multitest Elektronische Systeme GmbH

Multitest VP Bernhard Lorenz to Present at Test Vision 2020 Conference in Conjunction with SEMICON West

Industry News | 2012-07-02 18:54:44.0

Multitestannounces that VP Bernhard Lorenz will present at the upcoming Test Vision 2020 Conference,

Multitest Elektronische Systeme GmbH

Streamlined Spares Support ― Multitest Introduces e.services to Optimize Spare Parts Processing.

Industry News | 2010-04-30 15:19:28.0

Rosenheim, Germany - Multitest introduces e.services, the new online tool created to significantly save costs and time in spare parts processing. The easy-to-use online service allows users to minimize efforts for spare parts in both the operation and purchasing departments. Additionally, the online tool makes all related information readily available and easy to find.

Multitest Elektronische Systeme GmbH

Multitest Introduces Contactors for ICs with Differential Signals: Best Configurations Derived from 3-D Electromagnetic Simulation

Industry News | 2010-07-22 22:33:39.0

Multitest announces that it has designed differential contactors that are customized for each semiconductor test application. The selection of the contactor materials and probes are optimized for the desired impedance.

Multitest Elektronische Systeme GmbH

Multitest Experts to Present PCB Pad Wear Analysis Findings at BiTS 2011

Industry News | 2011-02-03 14:43:42.0

Multitest announces that Valts Treibergs, R&D Engineering Manager, and Chris Cuda, US Product Manager, will present "PCB Pad Wear Analysis at 0.4 mm Pitch ― the Story Continues…" at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, AZ.

Multitest Elektronische Systeme GmbH

Multitest Engineers to Hold Tutorial during BiTS 2011

Industry News | 2011-02-09 14:05:35.0

Multitest announces that Ryan Satrom, RF Engineer, and Jason Mroczkowski, RF Engineering and Product Manager, will hold a tutorial titled "Signal and Power Integrity in the Test Interface" at the upcoming Burn-in & Test Socket Workshop, scheduled to take place March 6-9, 2011 at the Hilton Phoenix East/Mesa Hotel in Mesa, AZ.

Multitest Elektronische Systeme GmbH

Multitest Successfully Concludes Test Cell Docking and Mounting Working Group SEMI CAST Releases Test Cell Docking and Mounting Terminology Guide

Industry News | 2012-09-28 09:04:41.0

Multitest announces that Business Unit Manager Günther Jeserer chaired the Docking and Mounting Working Group conducted by the Collaborative Alliance for Semiconductor Test (CAST), which began its activities under the SEMI organization in 2008.

Multitest Elektronische Systeme GmbH

Multitest’s James Quinn to Give Keynote Presentation during IPC ESTC 2013

Industry News | 2013-05-03 16:44:07.0

Multitest,announces that James Quinn, VP of Sales & Marketing, will be a keynote speaker at the upcoming IPC Electronic System Technologies Conference & Exhibition (ESTC), scheduled to take place May 20-23, 2013 at The New Tropicana in Las Vegas, Nevada.

Multitest Elektronische Systeme GmbH

1000th Gemini™ Kelvin Contactor Shipped – A Three Year Success Story

Industry News | 2010-04-20 10:02:26.0

St.Paul, Minnesota - Multitest’s ECT Interface Products group announces the shipment of its 1000th Gemini™ Kelvin contactor. The customer base for this product consists of satisfied customers around the world. All Gemini™ Kelvin customers have been repeat customers. In just three years, these contactors have become extremely successful because they provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-scale devices.

Multitest Elektronische Systeme GmbH

Continuous Innovation in Packaging and Manufacturing Processes: How to ensure best quality and process control at competitive cost?

Industry News | 2013-05-14 12:24:08.0

Multitest offers innovative approaches for test strategies of 3D ICs and Sensors – Meet Multitest at ECTC, May 28-30, Las Vegas

Multitest Elektronische Systeme GmbH


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