Industry News | 2012-11-06 15:34:50.0
Multitest, announces that its MT9510 x16 has proven its outstanding temperature accuracy of ±2.0°C at an Asian high-volume production site.
Industry News | 2010-06-23 12:15:55.0
Rosenheim, Germany — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Günther Jeserer, Business Unit Manager, will present a paper titled “Improved Cost of Test by Optimized Tester Utilization” at the upcoming SEMICON West exhibition, scheduled to take place July 13-15, 2010 at the Moscone Center in San Francisco.
Industry News | 2010-06-30 11:49:33.0
Multitest announces that it has once again been named one of the top ten chip making equipment suppliers in the annual Customer Satisfaction Survey conducted by VLSIresearch. The annual survey is conducted globally and provides industry-wide feedback on overall company performance.
Industry News | 2013-12-16 15:13:31.0
Multitest, announces that experts for 3D IC test will present at the European 3D TSV Summit in Grenoble, Jan 20-22, 2014.
Industry News | 2013-11-18 16:32:15.0
Multitest announces that its Mercury 040 Spring Probe Contactor has successfully passed more than five months of evaluation for a strip test application at a SEA high-volume production site.
Industry News | 2010-02-11 15:59:45.0
Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, will showcase its leading contactors at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/Mesa Hotel in Mesa, Ariz.
Industry News | 2010-11-24 13:47:37.0
Multitest's board division has successfully introduced a new LCR (layer count reduction) concept for high pin count BGA applications. Board customers now will benefit from significant cost savings without sacrificing performance. With the new LCR concept, the layer count of standard pitch BGA boards can be reduced by up to 40 percent.
Industry News | 2010-05-26 13:19:58.0
Rosenheim, Germany - For high pin count devices, the capability of multisite testing generally is limited by the required contacting force. Additionally, there are even complex, integrated ICs with an extremely high pin count for which even single site testing is critical because of too little contact force. The well-established tri-temp pick-and-place handler, MT9510XP, now offers an option to substantially increase the contact force. This new feature enables users to test even high pin count devices in up to eight contact sites in parallel.
Industry News | 2010-08-18 19:35:18.0
Multitest, the market leader for MEMS test and calibration equipment, sees great opportunities for the MEMS industry in Asia. Alex Chen, Taiwanese Regional Manager, recently became a member of the Semi Taiwan MEMS Committee to actively contribute to the success of the Asian MEMS industry.
Industry News | 2011-03-10 20:49:13.0
Multitest announces that another major fabless semiconductor manufacturer has evaluated and approved its Mercury-based wafer-level contactors. These Mercury contactors have eight sites and more than spring probes per site.
