Industry News | 2023-12-18 13:16:01.0
The full breadth of contextualized operations data now powers a manufacturing AI Copilot that can both suggest and implement corrective action on the shop floor.
Industry News | 2018-04-18 11:07:08.0
Chandler, Arizona – Not long ago, 2D inspection was the industry norm, but 3D inspection quickly proved itself as a more reliable technique. Today, true 3D measurement has become even more effective, especially when AI power analyzes the real data. But what is the difference between 3D inspection and 3D measurement, and how can AI improve your process?
Industry News | 2018-05-28 21:09:28.0
Seoul, South Korea – Koh Young Technology will exhibit “True 3D Smart Factory solutions powered by the AI platform” in booth 4C-20 at the upcoming JPCA show scheduled for June 6-8, 2018 at the Tokyo Big Sight in Japan. The company will highlight the high-speed Zenith UHS 3D AOI, KY8030-3 3D SPI, as well as comprehensive KSMART Industry 4.0 solution
Industry News | 2022-12-21 10:53:44.0
As a leading distributor of capital equipment for the electronics assembly industry in the UK and Ireland, Altus ensures its portfolio is the most advanced, and includes the best solutions for Smart facilities. One of its most recent additions not only meets these criteria, but is also an award winner.
Industry News | 2023-09-25 02:13:49.0
ViTrox, which aims to be the world's most trusted technology company, is thrilled to announce an upcoming technical sharing session led by our Product Marketing Manager, Ms. Tan Piet Gek. The event, scheduled for October 11, 2023, at 11:30 a.m. in Room 202 A/B, promises to shed light on the transformative potential of A.I. Deployment in Verification Tools for Inspection Equipment towards Smart Manufacturing.
Industry News | 2023-09-21 10:38:38.0
伟特科技，旨在成为全球最值得信赖的科技公司，将在2023年10月11日至13日参与 NEPCON Asia 2023，位于深圳国际会展中心(宝安新馆），展位号：#5D40。
Industry News | 2012-03-09 16:13:42.0
Seika Machinery will highlight its new, innovative products at the upcoming SMTA Indiana Expo & Trade Forum.
Industry News | 2021-11-12 04:01:56.0
Industry-First Imaging Technique and AI Achieving Reductions in Skill Requirements for High-Precision Inspection Innovative solutions and AI require less qualification and lead to improved high-precision inspection
Industry News | 2024-04-22 00:18:58.0
PENANG, MALAYSIA - APRIL 2024 ViTrox, which aims to be the World's Most Trusted Technology Company, proudly announces its recent accolades - the prestigious 2024 New Product Introduction Award from Circuits Assembly, received on March 6th, 2024. This distinguished recognition celebrates ViTrox's exceptional innovation and breakthrough showcased in the V510i Advanced 3D Optical Inspection (AOI) Solution for Advanced Packaging, the V810i Advanced 3D X-Ray Inspection (AXI) Solution - V810i 3D AXI S3 (Series 3) DL (Dual-Lane), and the V9i Advanced Robotic Vision (ARV) Solution - V9i ARV XL.
Industry News | 2020-09-23 11:45:08.0
Amkor Technology invites you to join us at the FREE Electronic Design Process Symposium (EDPS) virtual event September 30-October 1, 2020. EDPS is the leading forum for advanced chip and systems design processes. Amkor's Gerard John, Sr. Director, FCBGA, will present "Using Machine Learning to Optimize Semiconductor Test" on October 1st at 5:50 PM PST.? Abstract: Machine learning (ML) is a field of engineering under the artificial intelligence (AI) umbrella, based on the idea that systems can learn from data, identify patterns and make decisions with minimal human intervention. ML is often used as a prediction tool to perform analysis on large amounts of data, automate analytical model building and provide the user (human, machine or calling function) with event occurrence probability. To date, the test community has not embraced ML and continues to look at ML with skepticism when approached with the paradigm shift - replacing conventional product test suites with a test suite selected by an ML algorithm. This skepticism may be the result of multiple factors, such as limited familiarity with ML, partial awareness of its capabilities, lack of tools that can be easily used and the workload involved in the process of training a machine to discern data. In addition, by running a compressed test suite suggested by ML, questions arise about test escapees and their potential impact on product quality. This talk uses the example of an Open-Short test to shed light on optimizing semiconductor test using ML. For more information and to register for this FREE event, visit the EDPS website
