Industry News | 2012-06-20 14:00:03.0
JTAG Technologies, has introduced the JT 2149/DAF, a compact, mixed-signal (Digital/Analogue/Frequency) measurement module. The JT 2149/DAF is the first unit of its type to offer both digital and analogue test access to PCBs via JTAG Technologies’ widely-used QuadPod signal conditioning interface.
Industry News | 2011-06-14 14:37:55.0
The white light axial chromatism technique utilized by Nanovea’s 3D Non Contact Profilometers has become widely known as a vital bench top research and verification tool. It is now the Automated Optical Inspection (AOI) environments that have begun to acknowledge Nanovea’s superior capability. Unlike the traditional vision and laser systems that typically sacrifice one feature for another, speed or resolution, Nanovea provides both. Vision and laser systems also have very limited automated surface measurement options, where as Nanovea’s system provides a wide range including: Profile, Dimension, Roughness, Shape & Form, Flatness & Planarity, Volume Area, Step-Height Depth and Thickness. And keep in mind, the technique utilized by Nanovea’s inspection system has the superior ability to measure nearly any material surface and zero influence from sample reflectivity or absorption.
Industry News | 2016-06-19 19:21:45.0
JTAG Technologies – a specialist in board (PCBA) test solutions based on JTAG and IEEE 1149.x standards announce a new family of hardware adapters specifically designed for testing of a variety of DIMM & SODIMM sockets (sizes and styles) using a JTAG/boundary-scan controller and supporting software.
Industry News | 2019-11-27 10:27:07.0
“One-stop” expert consultation can keep semiconductor production on track through installation and beyond
Industry News | 2017-03-09 23:23:26.0
ADLINK Technology today announced the release of its new NEON-1021-M Intel® Atom™ E3845 processor-based ready-to-go smart camera with MVTec MERLIC. Equipping its state-of-the-art quad-core smart camera with an easy-to-use machine vision software, the NEON-1021-M significantly increases competitive advantage, exceeding basic smart camera advantages for machine vision development.
Industry News | 2016-12-02 11:33:11.0
One of the most exciting additions in version 5.8 of the Condor Sigma software is automatic grading for ball shear testing. Using the advanced Halcon library and high resolution perpendicular cameras with smart lighting systems, we have achieved successful determinations of failure modes for several customers. The computer can accurately determine the percentages of brittle and ductile failures.
Industry News | 2012-06-20 13:07:01.0
YesTech europe has recently completed a major Automated Optical Inspection (AOI) installation into TT electronics' Rogerstone manufacturing facility. The Case Study below, prepared in co-operation with TT electronics, explains why TT had to replace their existing AOI equipment with Yestech systems, as well as the quality and productivity benefits they gained by doing so. Of particular interest are TT's comments on how the Yestech solution has improved their confidence in their products and in their shipments to customers.
Industry News | 2008-03-14 15:40:02.0
HOUSTON � March 2008 � BPM announces that it will exhibit its Flashstream Flash Vector Programming System in booth 2245 at the upcoming APEX 2008 exhibition and conference, scheduled to take place April 1-3, 2008, in Las Vegas.
Industry News | 2009-04-08 20:45:36.0
HOUSTON � April, 2009 � BPM announces that it has been awarded an NPI Award in the category of Device Programming for its Flashstream Flash Vector Programming System. The award was presented to the company during a Monday, March 30, 2009 ceremony that took place in the Mandalay Bay Resort & Convention Center in Las Vegas before the start of APEX 2009.
