Industry News | 2008-02-28 21:48:17.0
OXFORD, CT � February 2008 � MIRTEC a leading global supplier of AOI systems to the electronics manufacturing industry, announces that it will introduce its MV series of AOI systems in booth 1857 at the upcoming APEX exhibition & conference scheduled to take place April 1-3, 2008 in Las Vegas.
Industry News | 2009-03-16 18:07:28.0
OXFORD, CT � March 2009 � MIRTEC, �The Global Leader in Inspection Technology,� announces that it will introduce the latest advancements to its MV Series of AOI systems as well as unveil the company's first In-Line SPI System, the MIRTEC MS-11, in booth 147 at the upcoming APEX exhibition & conference scheduled to take place March 31- April 2, 2009 in Las Vegas.
Industry News | 2018-05-20 18:15:51.0
MIRTEC, “The Global Leader in Inspection Technology,” today announced that Electrica Ltd. purchased an MV-3 OMNI 3D AOI system to help increase quality and productivity throughout all phases of their manufacturing process as the company engages with more customers in the high-reliability markets.
Industry News | 2013-11-15 17:15:52.0
Productronica 2013: The new MY200 performance series features a new linescan vision system and a new high-speed mount head, delivering twice the accuracy and higher throughput.
Industry News | 2001-08-01 16:17:49.0
Frame Grabber Provides Special Features for Line Scan Applications
Industry News | 2013-04-12 08:14:52.0
Following on from recent investments to augment its test facilities, including a new flying probe tester and additional AOI facilities, the investment continues at JJS Electronics with orders recently placed for a complete new state-of- the-art surface mount line. The line is in response to increased demand for their PCB assembly services and will be fully operational in January.
Industry News | 2013-03-12 14:11:50.0
After successfully launching the first X3 In-line X-Ray system in 2011, MatriX Technologies now presented its new X3L system in the USA. As of this year, besides the universal 3D inspection system X3, the X3L configuration is available with an innovative dual detector concept, combining a line-scan for transmission inspection of complete PCBs in a few seconds and a high-resolution digital flatpanel detector for selective 3D image capturing.
Industry News | 2001-08-01 16:03:56.0
Next Generation Embedded Frame Grabber
Industry News | 2001-08-01 16:27:32.0
Frame Grabber Provides Special Features for Line Scan Applications
Industry News | 2016-03-01 13:33:18.0
SAKI America will demonstrate its 3rd generation 3D automated optical inspection system at IPC APEX 2016, booth 1860. Saki's new 3D AOI, BF-3Di-Z1, accommodates XXL board sizes, offers dual-lane configurations, optional side angle cameras, and increases throughput by 15%. The 3D AOI system provides measurement of components with a height range from 0-20mm, achieving 1-micron height resolution, a false call rate of
winsouce.jpg)
.gif)
