Industry News | 2010-12-09 13:15:01.0
STI Electronics announces that Casey Cooper, Electrical Engineering/Microelectronics Lab Manager, will present "Conformal Coating Evaluation for Use in Harsh Environments Utilizing a Modified SIR Test Protocol" at the upcoming Pan Pacific Microelectronics Symposium & Tabletop Exhibition, scheduled to take place January 18-20, 2011at the Hapuna Beach Prince Hotel on the Big Island of Hawaii.
Industry News | 2021-01-27 04:42:24.0
Magnalytix, the forefront driver in providing real-time reliability solutions for electronics manufacturing, introduces the Magnalytix Technical Library, anenhancedknowledge base located initsWebsite's Tech Corner. The latest update connects manufacturing engineers with free inside expert knowledge regarding SIR testing and more.
Industry News | 2009-02-06 02:51:30.0
LOS ALAMITOS, CA � February 2009 � Practical Components Inc., the leading supplier of dummy components, announces that the new Practical Components B-52 CRET (Cleanliness & Residue Evaluation Test) Kit is designed to help determine the ionic cleanliness of a customer's manufacturing process. The test boards and components follow guidelines associated with the IPC-B-52 Test Vehicle.
Industry News | 2020-03-12 06:20:11.0
STI's Mark McMeen, VP, Engineering Services, will have a special presentation on How does one collect "Objective Evidence" to meet the new J-STD-001 Section 8.1 on electronic assembly cleanliness? The presentation take place at STI Electronics Inc.'s facility in Madison, AL on March 26, 2020 at 3 p.m. and will explore why this IPC standard came about and why the current "ROSE" test methodology is not enough for today's advanced designs. It will explore different tools and techniques as well as discuss how to gather objective evidence needed to meet the specification. There will be an actual demonstration of the equipment and test reports that are generated by the SIR test equipment along with the actual hardware that generates the test data that supports "Objective Evidence" for review. Do you know how "clean or dirty" your electronic manufacturing process and resulting hardware/assemblies are at completion?
Industry News | 2023-01-30 15:49:02.0
Magnalytix, providing real-time reliability solutions for electronics manufacturing, received a 2023 CIRCUITS ASSEMBLY NPI Award in the category of Functional Test for its MAGNALYTIX® OE-300 Surface Insulation Resistance (SIR) Testing System. The award was announced during a ceremony that took place Monday, Jan. 23, 2023 in San Diego.
Industry News | 2018-12-13 10:32:16.0
SIR and CAF testing have become significant demands by the industry in the drive to improve and enhance electronic circuit reliability.
Industry News | 2023-02-06 14:28:28.0
Gen3 will exhibit at Southern Manufacturing & Electronics 2023, scheduled to take place Feb. 7-9, 2023 at the Farnborough International Exhibition Centre. The company will showcase the AutoSIR2+™ Surface Insulation Resistance Testing System and a new CM+ Series demo unit in Stand L90. Additionally, AOI systems from MEK Europe BV will be on display.
Industry News | 2015-03-05 10:32:22.0
Gen3 Systems Limited is pleased to announce the company’s 30th anniversary. Since 1985, Gen3 Systems has been providing training and comprehensive in-house services for solderability, SIR, CAF and cleanliness testing.
Industry News | 2017-02-09 08:35:06.0
FARNBOROUGH, UK ― February 2017 ― Gen3 Systems Limited, a specialist British manufacturer and distributor, is pleased to announce that its Chief Technology Officer Dr Chris Hunt will present the paper titled “SIR intercomparison to validate the use of fine pitch pattern” at the upcoming IPC APEX EXPO. The presentation will be held during the session titled “SIR/Flux Reliability” on Tuesday the 14th February between 15:30 – 17:00pm in location 4.
Industry News | 2022-12-21 11:08:56.0
Magnalytix will exhibit at the 2023 IPC APEX EXPO, scheduled to take place Jan. 24-26, 2023 at the San Diego Convention Center in California. The company will display its new Magnalytix® OE-300 SIR Testing System in Booth #1318.
.jpg)
