Industry News: strobe test (Page 1 of 1)

CyberOptics' QX500™ Honored with a 2011 NPI Award

Industry News | 2011-04-20 20:17:27.0

CyberOptics Corporation announces that it has been awarded a 2011 NPI Award in the category of Test and Inspection – AOI for its QX500™ AOI System.

CyberOptics Corporation

CyberOptics to Debut Its Latest Inspection Solutions at electronicAmericas 2011

Industry News | 2011-03-01 15:41:56.0

CyberOptics Corporation announces that it will showcase its award-winning QX500™ AOI system and robust SE350™ SPI at the upcoming electronicAmericas conference and exhibition, scheduled to take place March 28-April 1, 2011 at Anhembi Park in São Paulo, Brazil. Cyberoptics’ representative in Brazil, HiTech, invites all attendees to visit booth #J81 for a firsthand demonstration of CyberOptics’ inspection systems.

CyberOptics Corporation

CyberOptics Earns Prestigious Industry Award for Its New AOI Tabletop System

Industry News | 2012-03-07 01:00:55.0

CyberOptics has been awarded a 2012 NPI Award in the category of Test & Inspection - AOI for its QX100™ AOI Tabletop System equipped with AI2 next-generation image analysis software.

CyberOptics Corporation

CyberOptics SE500ULTRA™ SPI Awarded for Excellence in the Asian Electronics Industry

Industry News | 2012-04-26 21:04:05.0

CyberOptics Corporation (Nasdaq: CYBE) announces that it has been awarded a 2012 EM Asia Innovation Award in the category of Test & Measurement / Inspection Systems – SPI for its SE500ULTRA™

CyberOptics Corporation

CyberOptics’ QX150i AOI Wins Its First Award during NEPCON China

Industry News | 2014-04-24 17:09:14.0

CyberOptics Corporation (Nasdaq: CYBE) announces that it was awarded a 2014 SMT China Vision Award in the category of Inspection & Testing – AOI for its latest product - QX150i™.

CyberOptics Corporation

Agilent Technologies Unveils Industry's First DDR2, DDR3 BGA Probe Solution for Oscilloscopes, Logic Analyzers

Industry News | 2008-01-28 23:33:58.0

Agilent Technologies Inc. (NYSE: A) today unveiled the industry's first DDR2 and DDR3 ball-grid array (BGA) probes for oscilloscopes and logic analyzers. The probes will be shown for the first time at DesignCon, here in Santa Clara, Feb. 4-6, 2008, Booth 305.

Agilent Technologies, Inc.

Coreco Imaging Introduces PC-CamLink frame grabber

Industry News | 2001-08-01 16:12:28.0

PCI bus-based Machine Vision Board Provides High Performance

Coreco Imaging

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