Industry News | 2008-05-23 16:57:31.0
Pomona, CA - May 2008 - Everett Charles Technologies (ECT) Semiconductor Test Group (STG) recently attended the 25th annual Teradyne Users Group (TUG) Conference Vendor Fair 2008.
Industry News | 2015-04-03 15:59:27.0
New System Architected to Optimize Digital Bus and Real-time Testing of Circuit Boards, Assemblies and Systems
Industry News | 2011-07-20 14:38:23.0
The British Contract Electronics Manufacturing Company eXception EMS has simplified and integrated Boundary Scan solutions into mainstream test strategy by incorporating equipment from GOEPEL electronic into a Teradyne test station.
Industry News | 2015-04-03 16:02:29.0
The Oasis Toolset is designed to address the unique test challenges posed by complex semiconductor devices.
Industry News | 2015-04-03 16:01:42.0
Sixth Generation RF Solution Focuses on Emerging LTE-Advanced and 802.11ac Challenges
Industry News | 2008-06-03 15:36:52.0
LITTLETON, MASS. - VJ Electronix, the leader in X-Ray inspection technology and Rework systems, announces that it named Ronald Lindell as its Director of Global Sales and Marketing in May 2008. Previous to joining VJ Electronix, Mr. Lindell served as the North American and Global Sales manager for the Assembly Test Division of Teradyne.
Industry News | 2015-04-03 16:04:35.0
New Real Time Audit (RTA) Tool for the UltraFLEX platform.
Industry News | 2015-04-03 15:55:21.0
New High Density (HD) Instruments Increase Parallel Test Capability for Both Wafer and Final Test of Image Sensors
Industry News | 2015-04-03 16:03:48.0
New versions of UltraFLEX digital and DC options provide greater pattern memory depth, data rates and accuracy to improve test quality and yield of ICs for mobile applications.
Industry News | 2014-03-19 07:37:44.0
For the first time ENGMATEC will be represented this year at a trade fair in the USA. In cooperation with Landrex Technologies the German company will exhibit at the APEX Expo, the premier event for the electronic industry.
