Industry News | 2007-03-16 13:06:46.0
OptoTherm has added a PCB Test Arm Probe to its product line. The Arm Probe is designed to provide quick and easy probing of surface mount devices (SMD).
Industry News | 2008-05-18 02:32:03.0
Richardson, TX (May 13, 2008) - ASSET InterTech (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, has joined the Mentor Graphics OpenDoor Program in order to ensure toolset interoperability for embedded instrumentation applications. Through the program ASSET and Mentor will enable the exchange of data between Mentor's chip-level inserted design-for-test (DFT) structures, such as the JTAG infrastructure, and ASSET's ScanWorks platform, which automates, accesses and analyzes embedded instrumentation and DFT data.
Industry News | 2015-04-22 14:52:28.0
Nordson DAGE, a division of Nordson Corporation (NASDAQ: NDSN), announces that it has been awarded a 2015 EM Asia Innovation Award in the category of Test Instruments for Camera Assist Automatic Bondtesting on the 4000Plus. The award was presented to the company during an April 22, 2015 ceremony at the Shanghai World Expo Exhibition & Convention Center during NEPCON China. This is the fourth award for this application.
Industry News | 2010-11-08 18:30:55.0
Acculogic's Manufacturing Test Systems Division announces the immediate availability of the latest addition to its family of in-circuit test (ICT) systems during Electronica 2010 at the New Munich Trade Fair in Munich, Germany.
Industry News | 2007-11-30 00:23:24.0
SANTA CLARA, Calif., Nov. 26, 2007 -- Agilent Technologies Inc. (NYSE: A) today announced its IO Libraries Suite 15.0, which has an improved LAN-discovery interface that simplifies the finding and configuring of LXI and other LAN-capable instruments.
Industry News | 2008-06-12 21:49:07.0
ScanWorks� integration into Cadence Encounter Digital IC Design Flow to provide deeper view into complex, packaged chips
Industry News | 2008-03-20 20:42:22.0
Several authors from Agilent's Digital Test Division have written chapters about High-Speed Physical Layer Characterization in the new Digital Communications Test and Measurement Handbook, co-edited by Dennis Derickson, California Polytechnic State University and Marcus Mueller, Agilent. The book covers basics, transmitter test, receiver test, and interconnect topics to verify system performance of high-speed digital links.
Industry News | 2008-08-22 16:48:20.0
Agilent Technologies Inc. (NYSE: A) today announced that it has added an extended interface module for Active State Power Management (ASPM) testing to its E2960B Series for PCI Express (PCIe(tm)) protocol test. This module provides lock of 11 Fast Training Sequences, the fastest lock time on the market.
Industry News | 2016-07-30 19:22:36.0
Ascentech LLC will exhibit and demonstrate new test and process optimization instruments and solutions at the upcoming SMTA Ohio Expo & Tech Forum August 4th 2016 in Independence (Cleveland) Ohio.
Industry News | 2016-09-08 13:43:04.0
Ascentech, LLC will exhibit and demonstrate new test and process optimization instruments and solutions at the upcoming SMTA International Conference and Exhibition in Rosemont, IL, Sep. 25 - 29, 2016. Ascentech will exhibit these new products in booth #219.
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