Industry News | 2018-10-18 08:14:11.0
How to Prevent the Tombstone and Open Defects during the SMT Reflow Process
Industry News | 2018-10-18 08:59:34.0
PRINCIPLE OF SURFACE MOUNT PROCESS(SMT PROCESS)
Industry News | 2018-12-08 03:29:29.0
SMT Dictionary – Surface Mount Technology Acronym and Abbreviation
Industry News | 2014-02-03 14:13:04.0
FCT Assembly is pleased to announce that it now offers a variety of anti-tombstoning solder pastes as an option with each of its solder paste fluxes.
Industry News | 2016-08-28 13:28:32.0
Saki Corporation will demonstrate its 2D and 3D automated optical inspection (AOI) systems at NEPCON South China in booth 1G35. Saki's AOI systems' unique Phase Measurement Profilometry technology and quad-directional side cameras inspect and measure QFNs, J-leads, and connectors, and enable the detection of the most difficult defects, such as lifted leads, tombstones, reverses, and height variations, without a reduction in speed. NEPCON South China is being held August 30-September 1, 2016 at the Shenzhen Convention & Exhibition Center, Shenzhen, China.
Industry News | 2012-02-10 16:56:29.0
ViTrox Technologies will demonstrate the V810 and V510 inspection solutions at Booth #1351 at the upcoming IPC APEX Expo.
Industry News | 2014-08-07 17:58:07.0
FCT Assembly today announced plans to exhibit at the SMTA Philadelphia and SMTA West Penn Expos.
Industry News | 2014-09-09 21:35:30.0
FCT Assembly today announced plans to exhibit in Booth # I105 at OctoberBest 2014, scheduled to take place Wednesday, October 1, 2014 at Tektronix in Beaverton, OR.
Industry News | 2011-09-19 16:58:41.0
Juki Automation Systems will exhibit its KE-1080 modular placement system and FlexSolder W510 in Booth #309 at the upcoming SMTA International Conference & Exhibition.
Industry News | 2015-11-04 20:05:54.0
Saki Corporation announces that its new 3D automated optical inspection, solder paste, and x-ray technology and equipment will be demonstrated at Productronica 2015, in Stand A2.239, as part of the theme "From Inspection to Measurement."
