SMT Express, Volume 5, Issue No. 3 - from SMTnet.com Machine Capability Measurement on SMT Equipment by Romain Schmitt, Jean Marie Guillet - Solectron Technology, Inc. Introduction by Michael Sivigny of EAGLE-EYED ONE
Comparing techniques for temperature-dependent warpage measurement Comparing Techniques for Temperature-Dependent Warpage Measurement Three full-field optical techniques, shadow moiré, fringe projection and digital image correlation (DIC