Economics, Technology Drive Industry To Non-Intrusive Board Test Economics, Technology Drive Industry To Non-Intrusive Board Test. Non-intrusive board test (NBT) has become an increasingly critical facet of contemporary board test strategies
Application Of Build-in Self Test In Functional Test Of DSL SMTnet Express May 23, 2012, Subscribers: 25234, Members: Companies: 8880, Users: 33129 Application Of Build-in Self Test In Functional Test Of DSL First published in the 2012 IPC APEX
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SMTnet Express, February 7, 2019, Subscribers: 31,653, Companies: 10,704, Users: 25,698 High Frequency Dk and Df Test Methods Comparison High Density Packaging User Group (HDP) Project Credits: Oracle Corporation The High Density Packaging (HDP
SMTnet Express, July 26, 2018, Subscribers:31,208, Companies: 11,001, Users: 24,976 Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of Printed Circuit Board Assembly Jun Balangue; Keysight Technologies This paper
Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages This paper presents the drop test reliability results for edge-bonded 0.5mm pitch lead-free chip scale
Overcoming Logistic, Economic and Technical Challenges to Implementing Functional Test in High Mix / High Volume Production Environments SMTnet Express November 28, 2012, Subscribers: 26024, Members: Companies: 9054, Users: 34001 Overcoming
SMTnet Express, May 20, 2021, Subscribers: 27,111, Companies: 11,359, Users: 26,657 Rapid Deployment of Automated Test-System for High-Volume Automotive USB-C Hub Adoption and integration of USB-C chargers and hubs in automotive