Comparing techniques for temperature-dependent warpage measurement Comparing Techniques for Temperature-Dependent Warpage Measurement Three full-field optical techniques, shadow moiré, fringe projection and digital image correlation (DIC
SMT Express, Volume 4, Issue No. 5 - from SMTnet.com Volume 4, Issue No. 5 Thursday, May 23, 2002 Featured Article Return to Front Page << Back to Page 1 Page 3 >> Knowing the capability coefficients, it is possible to estimate
SMT Express, Volume 5, Issue No. 3 - from SMTnet.com Return to Front Page << Back to Page 1 Page 3 >> Knowing the capability coefficients, it is possible to estimate the defect rate of the measured machine. For example, Cpk = 1
SMT Express, Volume 4, Issue No. 5 - from SMTnet.com Volume 4, Issue No. 5 Thursday, May 23, 2002 Featured Article Return to Front Page Machine Capability Measurement on SMT Equipment by Romain Schmitt, Jean Marie Guillet - Solectron
SMT Express, Volume 5, Issue No. 3 - from SMTnet.com Machine Capability Measurement on SMT Equipment by Romain Schmitt, Jean Marie Guillet - Solectron Technology, Inc. Abstract
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