SMTnet Express, April 14, 2016, Subscribers: 24,224, Companies: 14,786, Users: 40,027 Causes and Costs of No Fault Found Events Louis Y. Ungar; A.T.E. Solutions, Inc. A system level test, usually built-in test (BIT), determines that one or more
Application Of Build-in Self Test In Functional Test Of DSL SMTnet Express May 23, 2012, Subscribers: 25234, Members: Companies: 8880, Users: 33129 Application Of Build-in Self Test In Functional Test Of DSL First published in the 2012 IPC APEX
Virtual Access Technique Augments Test Coverage on Limited Access PCB Assemblies SMTnet Express May 3, 2012, Subscribers: 25098, Members: Companies: 8863, Users: 33057 Virtual Access Technique Augments Test Coverage on Limited Access PCB Assemblies
