testing to detect intra-IC interconnect assembly
SMTnet Express, April 14, 2016, Subscribers: 24,224, Companies: 14,786, Users: 40,027 Causes and Costs of No Fault Found Events Louis Y. Ungar; A.T.E. Solutions, Inc. A system level test, usually built-in test (BIT), determines that one or more
SMTnet Express July 25, 2013, Subscribers: 34972, Members: Companies: 13435, Users: 34972 Using Automated 3D X-Ray Inspection to Detect BTC Defects by Barbara Koczera; Test Research USA , An Qi Zhao; Flextronics Detecting marginal joints and other
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