SMTnet Express, May 20, 2021, Subscribers: 27,111, Companies: 11,359, Users: 26,657 Rapid Deployment of Automated Test-System for High-Volume Automotive USB-C Hub Adoption and integration of USB-C chargers and hubs in automotive
Using JTAG Emulation for Board-Level Functional Test Using JTAG Emulation for Board-Level Functional Test Demanding Test Requirements for Processor Based Boards As chip packaging and interconnectivity have become more dense and operate
SMTnet Express, June 16, 2022, Subscribers: 25,423, Companies: 11,577, Users: 27,294 █ Electronics Manufacturing Technical Articles Introduction to Automated Test Fixtures Testing of electronic assemblies involves three elements
Defect Coverage for Non-Intrusive Board Tests Defect Coverage for Non-Intrusive Board Tests Non-intrusive board test (NBT) is an emerging test methodology that integrates several complementary embedded-instrumentation-based test technologies
SMTnet Express, August 1, 2018, Subscribers: 31,235, Companies: 11,006, Users: 25,050 Early Design Review of Boundary Scan in Enhancing Testability and Optimization of Test Strategy Sivakumar Vijayakumar; Keysight Technologies With complexities
Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages This paper presents the drop test reliability results for edge-bonded 0.5mm pitch lead-free chip scale
