New Methods of Testing PCB Traces Capacity and Fusing New Methods of Testing PCB Traces Capacity and Fusing by: Norocel Codreanu, Radu Bunea, Paul Svasta; "Politehnica" University of Bucharest, Center for Technological Electronics
Power Supply Control from PCB to Chip Core Power Supply Control from PCB to Chip Core As silicon technology advances to enable higher density ASICs, the core logic voltage decreases. The lower voltage, in combination with higher current
