Defect Coverage for Non-Intrusive Board Tests Defect Coverage for Non-Intrusive Board Tests Non-intrusive board test (NBT) is an emerging test methodology that integrates several complementary embedded-instrumentation-based test technologies
Using JTAG Emulation for Board-Level Functional Test Using JTAG Emulation for Board-Level Functional Test Demanding Test Requirements for Processor Based Boards As chip packaging and interconnectivity have become more dense and operate
3D IC Development Needs Innovative Socket Solution 3D IC Development Needs Innovative Socket Solution Evolution from cell phones with only a base-band processor and limited memory to today's high-end phones with an additional applications
