Investigation of Pad Cratering in Large Flip-Chip BGA using Acoustic Emission SMTnet Express January 3, 2013, Subscribers: 26072, Members: Companies: 9076, Users: 34113 Investigation of Pad Cratering in Large Flip-Chip BGA using Acoustic Emission
Accurate Quantitative Physics-of-Failure Approach to Integrated Circuit Reliability Accurate Quantitative Physics-of-Failure Approach to Integrated Circuit Reliability Modern electronics typically consist of microprocessors and other complex
Strength of Lead-free BGA Spheres in High Speed Loading Strength of Lead-free BGA Spheres in High Speed Loading Concern about the failure of lead-free BGA packages when portable devices such as cell phones are accidentally dropped and a general
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