SMTnet Express, June 2, 2016, Subscribers: 24,776, Companies: 14,803, Users: 40,361 Characterization of Solder Defects on Package on Packages with AXI Systems for Inspection Quality Improvement Zhen Feng, Ph. D., David Geiger, Weifeng Liu, Ph. D
AOI-AXI Duo Improves Product Yield News Forums SMT Equipment Company Directory Calendar Career Center Advertising About FREE Company Listing! AOI-AXI Duo Improves Product Yield Automated optical inspection (AOI) and automated X
SMTnet Express August 15, 2013, Subscribers: 26214, Members: Companies: 13451, Users: 35059 A Printed Circuit Board Inspection System With Defect Classification Capability by I. Ibrahim, S. Bakar, M. Mokji, J. Mukred, Z. Yusof, Z. Ibrahim, K
Electrical Performance of an Organic, Z-interconnect, Flip-Chip Substrate Electrical Performance of an Organic, Z-interconnect, Flip-Chip Substrate Endicott Interconnect Technologies Credit/Source: Michael J. Rowlands, Rabindra Das More and more
Manufacture and Characterization of a Novel Flip-Chip Package Z-interconnect Stack-up with RF Structures Manufacture and Characterization of a Novel Flip-Chip Package Z-interconnect Stack-up with RF Structures More and more chip packages need
