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Accurate Quantitative Physics-of-Failure Approach to Integrated Circuit Reliability Accurate Quantitative Physics-of-Failure Approach to Integrated Circuit Reliability Modern electronics typically consist of microprocessors and other complex
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SMTnet Express, February 19, 2015, Subscribers: 22,404, Members: Companies: 14,224, Users: 37,735 Numerical Study on New Pin Pull Test for Pad Cratering Of PCB Billy Hu, Jesus Tan - Flextronics Pad cratering is an important failure mode besides
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