Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages This paper presents the drop test reliability results for edge-bonded 0.5mm pitch lead-free chip scale
Solder Materials Science Gets Small as Miniaturization Challenges Old Rules Solder Materials Science Gets Small as Miniaturization Challenges Old Rules Though designing much smaller packages presents its own unique set of hurdles (a topic
E Newsletter SMT Express The featured article for our Express Newsletter for the week of January 28, 2010, "The Universal PCB Design Grid System" was written by Tom Hausherr, EDA Library Product Manager, Valor Computerized Systems
