HALT Testing of Backward Soldered BGAs on a Military Product Online Version SMTnet Express, December 10, 2015, Subscribers: 23,782, Members: Companies: 14,767, Users: 39,402 Packaging Technology and Design Challenge for Fine Pitch Micro-Bump Cu
HALT Testing of Backward Soldered BGAs on a Military Product Online Version SMTnet Express, December 10, 2015, Subscribers: 23,782, Members: Companies: 14,767, Users: 39,402 Packaging Technology and Design Challenge for Fine Pitch Micro-Bump Cu
SMTnet Express, March 24, 2016, Subscribers: 24,113, Companies: 14,735, Users: 39,910 High Frequency DK and DF Test Methods Comparison High Density Packaging User Group (HDP) Project Karl Sauter; Oracle Corporation, Joe Smetana; Alcatel
SMTnet Express, April 14, 2016, Subscribers: 24,224, Companies: 14,786, Users: 40,027 Causes and Costs of No Fault Found Events Louis Y. Ungar; A.T.E. Solutions, Inc. A system level test, usually built-in test (BIT), determines that one or more
several challenges, including how to package a
SMT Express, Volume 5, Issue No. 12 - from SMTnet.com No HASL - What's the Hassle? Next worries for lead-free crossover is in testing The type of PCB finishes can directly affect results and performance at In-circuit Test. With the pursuit
