Express Newsletter: pin and to and pad (Page 6 of 28)

The Morphology Evolution and Voiding of Solder Joints on QFN Central Pads with a Ni/Au Finish

The Morphology Evolution and Voiding of Solder Joints on QFN Central Pads with a Ni/Au Finish SMTnet Express October 19, 2012, Subscribers: 25598, Members: Companies: 9011, Users: 33828 The Morphology Evolution and Voiding of Solder Joints on QFN

SMTnet Express - October 29, 2015

SMTnet Express, October 29, 2015, Subscribers: 23,683, Members: Companies: 14,724, Users: 39,236 Novel Approaches for Minimizing Pad Cratering Chen Xu, Yunhu Lin; Alcatel-Lucent, Yuan Zeng, Pericles A. Kondos; Unovis-Solutions.; Alcatel


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