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DOE for Process Validation Involving Numerous Assembly Materials and Test Methods

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SMTnet Express, July 13, 2017, Subscribers: 30,584, Companies: 10,624, Users: 23,496 Divergence in Test Results Using IPC Standard SIR and Ionic Contamination Measurements K. Tellefsen, M. Holtzer, T. Cucu, M. Liberatore, M. Schmidt - Alpha

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Stencil Printing of Small Apertures

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of the phase out of CFC’s and HCFC’s, standard s

The Effect of Coating and Potting on the Reliability of QFN Devices.

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