A Review of Test Methods and Classifications for Halogen-Free Soldering Materials A Review of Test Methods and Classifications for Halogen-Free Soldering Materials Over the last few years, there has been an increase in the evaluation and use
Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages This paper presents the drop test reliability results for edge-bonded 0.5mm pitch lead-free chip scale
Economics, Technology Drive Industry To Non-Intrusive Board Test Economics, Technology Drive Industry To Non-Intrusive Board Test. Non-intrusive board test (NBT) has become an increasingly critical facet of contemporary board test strategies
