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HALT Testing of Backward Soldered BGAs on a Military Product

-Pillar and BOT (Direct Bond on Substrate-Trace) Us

HALT Testing of Backward Soldered BGAs on a Military Product

-Pillar and BOT (Direct Bond on Substrate-Trace) Us

SMTnet Express - December 10, 2015

SMTnet Express, December 10, 2015, Subscribers: 23,782, Members: Companies: 14,767, Users: 39,402 Packaging Technology and Design Challenge for Fine Pitch Micro-Bump Cu-Pillar and BOT (Direct Bond on Substrate-Trace) Using TCNCP Myung-June Lee

SMTnet Express - Septemeber 8, 2016

SMTnet Express - October 18, 2018

SMTnet Express, October 18, 2018, Subscribers: 31,396, Companies: 11,063, Users: 25,294 Analysis of the Design Variables of Thermoforming Process on the Performance of Printed Electronic Traces Gill M., Gruner A., Ghalib N., Sussman M., Avuthu S

Influence of Nanoparticles, Low Melting Point (LMP) Fillers, and Conducting Polymers on Electrical, Mechanical, and Reliability Performance of Micro-Filled Conducting Adhesives for Z-Axis Interconnections.

Maximizing Production Productivity of Automatic Termination Machines

Laser Micromachining of Nanocomposite-Based Flexible Embedded Capacitors

Optimizing Flip Chip Substrate Layout for Assembly