SMTnet Express May 9, 2013, Subscribers: 26129, Members: Companies: 13373, Users: 34687 Impact of Dust on Printed Circuit Assembly Reliability by: Bo Song, Michael H. Azarian, Michael G. Pecht; CALCE Atmospheric dust consists of solids suspended
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Investigation of Pad Cratering in Large Flip-Chip BGA using Acoustic Emission SMTnet Express January 3, 2013, Subscribers: 26072, Members: Companies: 9076, Users: 34113 Investigation of Pad Cratering in Large Flip-Chip BGA using Acoustic Emission
SMTnet Express January 31, 2013, Subscribers: 26152, Members: Companies: 9105, Users: 34242 Projection Moiré vs. Shadow Moiré for Warpage Measurement and Failure Analysis of Advanced Packages There are three key industry trends that are driving
