Comparing techniques for temperature-dependent warpage measurement Comparing Techniques for Temperature-Dependent Warpage Measurement Three full-field optical techniques, shadow moiré, fringe projection and digital image correlation (DIC
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SMTnet Express, May 21, 2015, Subscribers: 22,770, Members: Companies: 14,358, Users: 38,224 Reliability of Embedded Planar Capacitors under Temperature and Voltage Stress Mohammed A. Alam, Michael H. Azarian, Michael Osterman and Michael Pecht
SMTnet Express, January 2, 2020, Subscribers: 33,306, Companies: 10,954, Users: 25,467 Temperature Cycling and Fatigue in Electronics Credits: DfR Solutions The majority of electronic failures occur due to thermally induced stresses and strains
