SMTnet Express, December 17, 2015, Subscribers: 23,898, Members: Companies: 14,823, Users: 39,585 Good Product Quality Comes From Good Design for Test Strategies Adrian Cheong; Agilent Technologies, Inc. Product quality can be improved through
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Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages This paper presents the drop test reliability results for edge-bonded 0.5mm pitch lead-free chip scale
Overcoming Logistic, Economic and Technical Challenges to Implementing Functional Test in High Mix / High Volume Production Environments SMTnet Express November 28, 2012, Subscribers: 26024, Members: Companies: 9054, Users: 34001 Overcoming
The Application of Spherical Bend Testing to Predict Safe Working Manufacturing Process Strains SMTnet Express January 9, 2013, Subscribers: 26086, Members: Companies: 9075, Users: 34138 The Application of Spherical Bend Testing to Predict Safe
SMTnet Express, January 31, 2019, Subscribers: 31,643, Companies: 10,701, Users: 25,678 Novel Pogo-Pin Socket Design for Automated Low Signal Linearity Testing of CT Detector Sensor Credits: General Electric Due to the arrayed nature
SMTnet Express, February 7, 2019, Subscribers: 31,653, Companies: 10,704, Users: 25,698 High Frequency Dk and Df Test Methods Comparison High Density Packaging User Group (HDP) Project Credits: Oracle Corporation The High Density Packaging (HDP
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