SMTnet Express, May 5, 2022, Subscribers: 25,613, Companies: 11,567, Users: 27,202 Electronics Manufacturing Technical Articles Rapid Deployment of Automated Test-System for High-Volume Automotive USB-C Hub Adoption and integration
Defect Coverage for Non-Intrusive Board Tests Defect Coverage for Non-Intrusive Board Tests Non-intrusive board test (NBT) is an emerging test methodology that integrates several complementary embedded-instrumentation-based test technologies
: the device under test, test equipment, and fix
Application Of Build-in Self Test In Functional Test Of DSL SMTnet Express May 23, 2012, Subscribers: 25234, Members: Companies: 8880, Users: 33129 Application Of Build-in Self Test In Functional Test Of DSL First published in the 2012 IPC APEX
SMTnet Express, June 21, 2018, Subscribers: 31,123, Companies: 10,968, Users: 24,855 Design for Testability (DFT) to Overcome Functional Board Test Complexities in Manufacturing Test Louis Y. Ungar; A.T.E. Solutions, Inc. Manufacturers test
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SMTnet Express, July 13, 2017, Subscribers: 30,584, Companies: 10,624, Users: 23,496 Divergence in Test Results Using IPC Standard SIR and Ionic Contamination Measurements K. Tellefsen, M. Holtzer, T. Cucu, M. Liberatore, M. Schmidt - Alpha
SMTnet Express, December 1, 2016, Subscribers: 27,507, Companies: 15,035, Users: 41,441 Review of Interconnect Stress Testing Protocols and Their Effectiveness in Screening Microvias Edward Arthur; Raytheon , Charles Busa, Wade Goldman P.E., Alisa
