Ultra-High speed measuring Measuring rate up to 40 steps per second helps reduce tact times and can actually be used in fully automated production lines averting a bottleneck. This is indeed a unique strength of Hioki’s flying probe testers. Fine pi
“The Ultimate Probing Machine”. Ultra Fast full Function Patented Double-sided, Closed Loop 22-probe System, All probes are Analog, Digital, Boundary Scan, and Vectorless Test enabled. Use it In-Line or manual operation with AOI capabilities. The
Data I/O's premier automated programming system PSV7000 with tray to tray integrated media I/O option for semiconductor devices
20 MOhm voltage 250 Ohm current +/- 0.01 % Absolute accuracy error +/- 0.05 % of full scale +/- 0.1 % of full scale maximum Linearity error +/- 0.04 % Accuracy drift according to +/- 0.0025 % of full scale/â°C temperature Common mode rejectio
The Condor Sigma W12 is specifically designed for precision shear testing and Cold Bump Pull (CBP) on wafer or at wafer level. The system has the largest X/Y and fastest stages available in the industry, to reach all positions on the wafer with the t
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