Industry News: bf-3di-d (2)

Saki Debuts 3rd Generation 3D AOI Inspection Systems at NEPCON Japan Booth E17-46

Industry News | 2016-01-11 09:28:35.0

Saki also demonstrates 3D automated X-ray inspection and measurement systems.

SAKI America

Saki Demonstrates 3D AOI Systems at NEPCON South China Booth 1G35

Industry News | 2016-08-28 13:28:32.0

Saki Corporation will demonstrate its 2D and 3D automated optical inspection (AOI) systems at NEPCON South China in booth 1G35. Saki's AOI systems' unique Phase Measurement Profilometry technology and quad-directional side cameras inspect and measure QFNs, J-leads, and connectors, and enable the detection of the most difficult defects, such as lifted leads, tombstones, reverses, and height variations, without a reduction in speed. NEPCON South China is being held August 30-September 1, 2016 at the Shenzhen Convention & Exhibition Center, Shenzhen, China.

SAKI America

Partner Websites: bf-3di-d (19)

Microscopes and Accessories: World Equipment Source

| https://www.wesource.com/microscopes-and-accessories/?p=catalog&mode=catalog&parent=18&pg=1&pagesize=24

/0.90 D PL AP0 No. 567043 ID_000166 (6/22) Price: $475.00 Meiji Japan Microscope Objective S. FlatField 4x/0.10 160/0.17 No. 18069 ID_000162 (6/22) Price: $54.00 Microscope Objective 10

ASM Accessories6-Equipment Accessories-Suzhou Feierte electronic co.,ltd-welcome to KD Electronic

KD Electronics Ltd. | http://www.kundasmt.com/?A-Equipment-Accessories/6010.html

1.1 03084725-03 rocker X16 N 03084754-02 Clamp Unit SX4 2.1 03084825-01 Splitter cable DVI-D with ferrites 03084876S02 foil rocker unit cpl

KD Electronics Ltd.


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