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These evaluation boards should be used to facilitate analysis of Z-Communications' PLLs (part numbers beginning with PCA, PSN, or PSA). The MINIEVAL/SMVEVAL/USSPEVAL boards all feature the same SMA connectorized input/output ports as shown in Figure
Electronics Forum | Wed Nov 11 09:52:46 EST 2015 | dekhead
Are we to infer no bias in this commentary?
Electronics Forum | Mon Dec 06 17:02:52 EST 1999 | Michael Stewart
Have you ever tried using a vision system for measuring the part placement accuracy and then clacualting the Cpk's from these results, or do you strictly use the machine vision itself? My concern with using the machine vision is that it it is biased
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are availa
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are availa
Industry News | 2003-05-30 08:09:11.0
A new compact package integrates a Hall-effect sensor IC with a back-biasing magnet to achieve high airgap performance and meet restrictive space requirement.
Industry News | 2012-08-30 20:34:57.0
The SMTA announced the Doctor's Hours program will be held for the third consecutive year at SMTA International, taking place October 14-18, 2012 in Orlando, FL
Technical Library | 2009-10-14 21:17:47.0
Electrochemical migration (ECM) is defined as the growth of conductive metal filaments across a printed circuit board (PCB) in the presence of an electrolytic solution and a DC voltage bias. ECM, also known as dendritic growth, is a critical issue in the electronics industry because the intermittent failure behavior of ECM is a likely root-cause of the high occurrence of field failures identified as no trouble found (NTF)/could not duplicate (CND)
Technical Library | 2017-07-27 16:51:57.0
Reliability Expectations of Highly Dense Electronic Assemblies is commonly validated using Ion Chromatography and Surface Insulation Resistance. Surface Insulation Resistance tests resistance drops on both cleaned and non-cleaned circuit assemblies. It is well documented in the literature that SIR detects ionic residue and the potential of this residue to cause leakage currents in the presence of humidity and bias. Residues under leadless components are hard to inspect for and to ensure flux residue is totally removed. The question many assemblers consider is the risk of residues that may still be present under the body of components.
Option 032 version: 20 Hz to 300 kHz 0.05% basic accuracy with superior measurement repeatability at low and high impedance 16 impedance parameters 4-digit resolution in any range High-resolution 7-digit LCD display 100 µ Vrms, 1 µA
The new BTS Master is an integrated multi functional base station test tool eliminating the need to carry and learn multiple test sets. The MT8222A measurement capabilities include spectrum analysis including smart measurements, precision return loss
Career Center | Dallas, Texas USA | Engineering
Job description: Engineer is responsible for the design of RF, Microwave and support circuitry for miniaturized Rf/Wireless modules utilizing highlt integrated semiconductors and an array of substrate and packaging technologies. Will design, simula
Career Center | San Diego, California USA | Sales/Marketing,Technical Support
Do you want to put your dent in the universe? Are you are tired of being part of a slow moving bureaucratic coatings organization that sells old technology, can’t get things done and seems to create processes to hinder the selling process? Are y
Career Center | , | 2013-01-31 04:29:34.0
• Programming of AOI, SPI and Routing m/c’s. • SMT(Surface Mount Technology) • Basic Electronics • Semi Conductors • Operating System: Windows- 98/XP/Vista/7 • MS Office: 2003/2007/2010
Career Center | , | 2013-01-31 04:45:28.0
• Programming of AOI, SPI and Routing m/c’s. • SMT(Surface Mount Technology) • Basic Electronics • Semi Conductors • Operating System: Windows- 98/XP/Vista/7 • MS Office: 2003/2007/2010
PCB Libraries, Inc. | https://www.pcblibraries.com/POD/Default.asp?M=ACTIVESEMI&PN=ACT6357NH-T
: IC, High-Efficiency, 40V Step-Up WLED Bias Supplies Physical Description: Small Outline No-Lead (SON) with tab, 0.65 mm pitch; 9 pin, 3.00 mm L X 3.00 mm W X 0.80 mm H body Commonly Visited: Discussion Forum Software User Guide Free Downloads Contact us Websites Contact Sales, Training, Support
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/march/support/plasma-learning-center/primary-plasma
) bias on the powered electrode. The self DC-bias is useful for applications which require more aggressive and anisotropic etching. There are two variations of primary plasma
