Industry News | 2015-09-03 17:01:47.0
Today, Congressman Paul Ryan (R-WI-1), Chairman of the House of Representatives Committee on Ways and Means, met with executives and employees of IPC-member company Creation Technologies at the company's manufacturing facility in Oak Creek, Wisconsin. Coordinated by IPC, the world’s leading association for electronics manufacturing companies, this visit is part of a nationwide effort to inform policymakers about legislative and regulatory issues that affect the electronics manufacturing industry.
Industry News | 2011-05-16 15:41:07.0
CyberOptics is delighted to announce that it has been awarded a 2011 EM Asia Innovation Award in the category of Inspection Equipment – AOI for its revolutionary, multi-award winning QX500™ AOI System.
Technical Library | 2017-06-22 17:11:53.0
C-mode scanning acoustic microscopy (C-SAM) is a non-destructive inspection technique showing the internal features of a specimen by ultrasound. The C-SAM is the preferred method for finding “air gaps” such as delamination, cracks, voids, and porosity. This paper presents evaluations performed on various advanced packages/assemblies especially flip-chip die version of ball grid array/column grid array (BGA/CGA) using C-SAM equipment. For comparison, representative x-ray images of the assemblies were also gathered to show key defect detection features of the two non-destructive techniques.
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/sonoscan/support/application-notes/2614-c-sam-and-q-bam
cross-section - Application Note 2614 Sample & Method This BGA was first imaged in planar mode by C-SAM (bottom half of image). Along the white line drawn across the planar image, a cross-sectional Q-BAM image was then made (top half of image
ORION Industries | http://orionindustries.com/sam.php
". Both current and potential federal government registrants are required to register in SAM in order to be awarded contracts by the federal government
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