New Equipment | Test Equipment
The Huntron Tracker 2000 provides advanced troubleshooting capabilities to simplify testing newer technology components such as CMOS and MOS circuits. Its built-in pulse generator lets you thoroughly troubleshoot gate-fired devices such as SCRs, TRIA
The XT-6 is a highly flexible X-ray inspection system featuring a parallel-kinematic Hexaglide manipulation unit that allows extreme off-axis X-ray transmission in the smallest of space with maximum speed and in high resolution. This technology is es
Electronics Forum | Tue Nov 10 19:31:09 EST 2020 | mikewschomisch
I have been able to manually enter CMOS info in SETUP thanks to suggestions from this forum and get past the CMOS and EEPROM failures. Now stuck "diskette error". Any key will produce the same message. Thanks.
Electronics Forum | Tue Nov 10 19:46:13 EST 2020 | dekhead
Still t issue if yu remove FDD from boot sequence?
Used SMT Equipment | X-Ray Inspection
• Nordson DAGE VR950 new technology, open, transmissive X-ray tube: -All voltages can reach <0.95 micron feature resolution – The highest voltage is 160KV, target power: 3W -Long service life of filament components -Automatic st
Industry News | 2011-05-12 22:07:58.0
Nordson DAGE, a division of Nordson Corporation (NASDAQ: NDSN) launched its new Diamond FP and Ruby high-resolution X-ray inspection systems earlier today at Nepcon Shanghai.
Industry News | 2014-01-30 10:06:15.0
JUKI announces the launch of the RV-1 PWB inspection machine, which significantly improves inspection accuracy and speed with both automatic optical inspection (AOI) and solder paste inspection (SPI) functions.
Technical Library | 2012-12-14 14:28:20.0
This paper examines the potential failure mechanisms that can damage modern lowvoltage CMOS devices and their relationship to electrical testing. Failure mechanisms such as electrostatic discharge (ESD), CMOS latch-up, and transistor gate oxide degradation can occur as a result of electrical over-voltage stress (EOS). In this paper, EOS due to electrical testing is examined and an experiment is conducted using pulsed voltage waveforms corresponding to conditions encountered during in-circuit electrical testing. Experimental results indicate a correlation between amplitude and duration of the pulse waveform and device degradation due to one or more of the failure mechanisms.
Highly flexible, multi-axis inspection system featuring a parallel-kinematic Hexaglide manipulation unit that allows extreme off-axis X-ray transmission in the smallest of space with maximum speed and in high resolution. This technology is especially
energy-efficient solid-state switches beyond CMOS
Surface Mount Technology Association (SMTA) | https://www.smta.org/panpac/Pan-Pacific-2020-Program.pdf?v=20060405647
& Creep Corrosion Chair: *Dave Raby, STI Electronics, Inc. LOCATION Session 2 - Test Methods Chair: *Keith Bryant, KB Consultancy 8:30AM - 9:00AM Lehua/Hau ECM and IoT - How to Predict, Quantify, and Mitigate ECM Failure Potential
GPD Global | https://www.gpd-global.com/co_website/pdf/doc/Dispenser-Software-Recovery-Guide-22144015.pdf
. In the event of a disaster, such as a complete hard disk failure, you can boot from a single USB flash drive and restore an operable system within five minutes
