Electronics Forum: electromigration voltage (9)

What is the preffered spacing between PTH and SMT pads

Electronics Forum | Wed Apr 29 04:57:08 EDT 2009 | davepick

It depends on the application what will be considered the biggest issue to avoid (production or longterm reliability). Tin Whiskers are bit of an unknown quantity - but a more realistic problem could be dendritic growth / electromigration forming sho

Fog Test

Electronics Forum | Fri Jul 26 17:02:07 EDT 2002 | davef

Never heard of flux residues forming a lense. The first thing that comes mind when thinking about your 'fog test' is: Ionic Contamination While this seems pretty far afield from your interest in optical effects, I'll continue briefly. A reverse

Used SMT Equipment: electromigration voltage (3)

Keithley AR178238-50

Used SMT Equipment | In-Circuit Testers

Keithley 238 Keithley 238 High-Current Source-Measure Unit Key Features and Benefits:     Four instruments in one (voltage source, voltage measure, current source, current measure)     10fA, 10μV measurement sensitivity     1A source and me

Test Equipment Connection

Keithley 238

Keithley 238

Used SMT Equipment | General Purpose Test & Measurement

Key Features and Benefits:     Four instruments in one (voltage source, voltage measure, current source, current measure)     10fA, 10μV measurement sensitivity     1A source and measure     Standard and custom sweep capability including pulse

Test Equipment Connection

Express Newsletter: electromigration voltage (32)

SMTnet Express June 13 - 2013, Subscribers: 26140

SMTnet Express June 13, 2013, Subscribers: 26140, Members: Companies: 13397, Users: 34803 Electromigration damage mechanics of lead-free solder joints under pulsed DC: A computational model by: Wei Yao, Cemal Basaran; Electronic Packaging


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