New Equipment | Test Equipment
The Huntron Tracker 2000 provides advanced troubleshooting capabilities to simplify testing newer technology components such as CMOS and MOS circuits. Its built-in pulse generator lets you thoroughly troubleshoot gate-fired devices such as SCRs, TRIA
Electronics Forum | Thu Feb 22 13:11:51 EST 2001 | keithtbe
Silver epoxy is used to joint the LED beam lead and the trace of the flexi circuit. Due to the LED mounted skew upward or downward unconsistently, the strength of the joint weakened and causing the LED lights up intermittently. I would like to ask fo
Electronics Forum | Tue Sep 10 08:46:10 EDT 2013 | rway
You're in the wrong forum. I doubt anyone here will have any experience with your type of issue (without researching it). Have you tried the dealer or a dealer related forum?
Used SMT Equipment | General Purpose Test & Measurement
The affordable TLA5000 Series logic analyzers make high-speed timing resolution, fast state acquisition, long record length and sophisticated triggering available to any digital designer who needs to identify initialization failures, operation crashe
Used SMT Equipment | General Purpose Test & Measurement
The Fluke 43 Power Quality Analyzer performs the measurements you need to maintain power systems, troubleshoot power problems and diagnose equipment failures. All in a rugged handheld package. Features: Combines the most useful capabilities of
Industry News | 2021-08-13 12:58:35.0
The SMTA Capital Chapter, Carolinas Chapter and Philadelphia Chapter are excited to host their first ever tri-chapter event, Mid-Atlantic Advanced Learning Session - Failure is Never an Option, A Deep Dive into Failure Analysis.
Industry News | 2017-08-26 20:18:39.0
SMTA and SMART Group are excited to announce plans to co-organize the Electronics in Harsh Environments Conference. The event will be held April 24-26, 2018 in Amsterdam, Netherlands. The conference will focus on building reliable electronics used in power electronics and harsh environments.
Technical Library | 2020-12-07 15:26:06.0
Temperature cycling testing is a method of accelerated life testing done to PCCs that are exposed to normal operation temperature variations over its lifetime. During the testing, intermittent "open" failures can first occur at the hot and cold extremes of the test, exposing weaknesses in the design and assembly. A poor/weak solder joint fatigues, a via trace or barrel cracks, loose connections or a component fails all causing an intermittent open. When not at extreme temperatures, the PCC assembly relaxes, the "open" closes creating electrical connectivity. If you are monitoring the PCC under test in-situ you will know that an intermittent failure has occurred, and the test could be stopped for inspection. If in-situ monitoring was not implemented, you would not know if there were intermittent failures or not. The PCC gets powered up and works fine at room temperature.
Technical Library | 2020-05-08 18:22:31.0
A customer contacted the Helpline to perform analysis on a lead-free assembly which exhibited intermittent functionality. The lead-free assembly exhibiting intermittent functionality when pressure was applied to the ball grid array (BGA) packages. Industrial adaptation of a Restriction of Hazardous Substances (RoHS) compliant solder standard has created a new host of failure modes observed in lead-free assemblies. Pad cratering occurs when fractures propagate along the epoxy resin layer on the underside of the BGA connecting pads. While originating from process, design, and end use conditions, it is the combination of a rigid lead-free solder with inflexible printed circuit board (PCB) laminates that has advanced the prevalence of this condition. Pad cratering is simply the result of mechanical stress exceeding material limitations.
Hear what attendees had to say about the Electronics in Harsh Environments Conference. Start planning your participation for the 2020 event: 21-23 April 2020 | Amsterdam, Netherlands https://www.smta.org/harsh
Events Calendar | Tue Apr 21 00:00:00 EDT 2020 - Thu Apr 23 00:00:00 EDT 2020 | Amsterdam, Netherlands
Electronics in Harsh Environments Conference
Events Calendar | Tue May 17 00:00:00 EDT 2022 - Thu May 19 00:00:00 EDT 2022 | Amsterdam, Netherlands
Electronics in Harsh Environments Conference and Exhibition
Career Center | Addison,Texas, Texas USA | Engineering
NO SPONS,YES WILL RELO, KEY WORDS,GENRAD 228X,HP3070 TEST EQUIPMENT.PLEASE POST. Designing, developing and maintaining test procedures, tester hardware and software for electronic circuit board production. Reviewing circuit board design for testabili
Career Center | banaglore, karnataka India | Maintenance,Production,Quality Control,Technical Support
tel u later
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/industries/packaging?page=16
. Polymer Processing Systems VarioCoat™ Liquid Adhesive Applicators Flexible liquid adhesive application for continuous or intermittent dispensing Adhesive Dispensing Systems Vision Systems Nordson DAGE offers a range of powerful optical
Heller Industries Inc. | https://hellerindustries.com/wp-content/uploads/2018/06/689011_Heller-XP_software_log_HC1_controller-4021.pdf
: Blower failure Warning/Alarm with selectable delay time - Added 1707 model - Heller Industries, Inc. Page 4 of 5 PN: 689011 Rev-I Heller Oven Windows-XP Software Version log for HC1 controller