Industry Directory: measure fail (1)

CAMI Research Inc.

Industry Directory | Consultant / Service Provider / Manufacturer

CableEye® continuity and HiPot pass/fail & diagnostic Cable & Harness Test Systems w simple scripting, labeling, documentation, cataloging & relay control. Dynamically display continuity, Ω, diodes, IR, dielectric breakdown & more

New SMT Equipment: measure fail (31)

Automatic Piranha LED Heating & Sorting Machine

Automatic Piranha LED Heating & Sorting Machine

New Equipment | Tape and Reel Equipment

Automatic Piranha LED Heating & Sorting Machine Features: Tube In / Tube Out: 2 fail bins, 1 pass bin with storage of 25 plastic tubes are available for sorting. Exact Orientation: To ensure the measurement accuracy, H325 applies precise positio

Plastlist Group

Agilent/HP 8753ES /006/011/ RF Network Analyzer

Agilent/HP 8753ES /006/011/ RF Network Analyzer

New Equipment | Test Equipment

The Agilent 8753ES / HP 8753ES RF network analyzer’s ease of use and high performance make it ideal for use in research and development as well as on the production floor. The integrated S-parameter test set covers ranges from 30 kHz to 3 or 6GHz and

Recon Test Equipment Inc.

Electronics Forum: measure fail (113)

AOI false fail PPM

Electronics Forum | Wed Jul 30 07:39:18 EDT 2008 | lococost

Anyone else? This is an interresting question. With 1000PPM won't your AOI be worse then the process it is supposed to measure? Won't your AOI become more of a bling thing to impress customers than an actual usefull tool to improve process quality

ROSE testing pass / fail

Electronics Forum | Tue Feb 22 02:51:25 EST 2022 | davef

The industry standard for Resistivity of Solvent Extract (ROSE) Testing analysis is IPC-TM-650 Method 2.3.25 – Detection and Measurement of Ionizable Surface Contaminants by Resistivity of Solvent Extract (ROSE).

Used SMT Equipment: measure fail (60)

LeCroy WaveJet 354T

LeCroy WaveJet 354T

Used SMT Equipment | General Purpose Test & Measurement

minimum investment. Key Features • 350 MHz and 500 MHz bandwidths • Up to 2 GS/s sample rate • Long Memory • up to 5 Mpts • 7.5” touch screen display • 26 measurement parameters • Replay mode • Standard Pass/Fail Mask and Measurement testi

Test Equipment Connection

Agilent 3784A-008

Agilent 3784A-008

Used SMT Equipment | General Purpose Test & Measurement

The HP 3784A is a portable error performance/jitter test set, offering standard telecom interfaces at 704 kb/s, 2, 8, and 34 Mb/s. In addition it has binary TTL/ECL interfaces for measurements up to 50 Mb/s using internal clock synthesizer.5 The HP 3

Test Equipment Connection

Industry News: measure fail (110)

Introbotics Announces New Board Testing Capability for Merix Corporation

Industry News | 2003-04-01 08:13:08.0

The Introbotics equipment boosts controlled impedance testing productivity and accuracy by a factor of ten compared to the handheld probing techniques.

SMTnet

IPC/JEDEC-9704A Takes the Stress Out of Strain Gage Testing

Industry News | 2012-05-23 14:18:26.0

Joint Industry Guideline Provides Best Practices for Measuring the Strain on Boards and Components During Manufacturing

Association Connecting Electronics Industries (IPC)

Parts & Supplies: measure fail (2)

Juki JUKI 2050 machine failure solution

Juki JUKI 2050 machine failure solution

Parts & Supplies | Pick and Place/Feeders

JUKI 2050 machine failure solution KE2050M Z-axis fault E620014 error handling method! Suddenly heard the sound of the machine. The machine stopped the fault for the E620014Z axis drive alarm. View the drive. For Z drive 1, the third light is on

ZK Electronic Technology Co., Limited

Kikusui TOS5050A

Kikusui TOS5050A

Parts & Supplies | General Purpose Test & Measurement

Description: The TOS5050A are designed exclusively for hipot testing of electronic equipment and components conforming to various safety standards. The model TOS5050A is the type having with 5kV output in AC only. Complies with various safety s

Avid Technology Ltd

Technical Library: measure fail (3)

Evaluation of No-Clean Flux Residues Remaining After Secondary Process Operations

Technical Library | 2023-04-17 17:05:47.0

In an ideal world, manufacturing devices would work all of the time, however, every company receives customer returns for a variety of reasons. If these returned parts contributed to a fail, most companies will perform failure analysis (FA) on the returned parts to determine the root cause of the failure. Failure can occur for a multitude of reasons, for example: wear out, fatigue, design issues, manufacturing flaw or defect. This information is then used to improve the overall quality of the product and prevent reoccurrence. If no defect is found, it is possible that in fact the product has no defect. On the other hand, the defect could be elusive and the FA techniques insufficient to detect said deficiency. No-clean flux residues can cause intermittent or elusive, hard to find defects. In an attempt to understand the effects of no-clean flux residues from the secondary soldering and cleaning processes, a matrix of varying process and cleaning operation was investigated. Of special interest, traveling flux residues and entrapped residues were examined, as well as localized and batch cleaning processes. Various techniques were employed to test the remaining residues in order to assess their propensity to cause a latent failure. These techniques include Surface Insulation Resistance1 (SIR) testing at 40⁰C/90% RH, 5 VDC bias along with C32 testing and Ion Exchange Chromatography (IC). These techniques facilitate the assessment of the capillary effect the tight spacing these component structures have when flux residues are present. It is expected that dendritic shorting and measurable current leakage will occur, indicating a failing SIR test. However, since the residue resides under the discrete components, there will be no visual evidence of dendritic growth or metal migration.

Foresite Inc.

Using Rheology Measurement As A Potentially Predictive Tool For Solder Paste Transfer Efficiency And Print Volume Consistency

Technical Library | 2020-07-02 13:29:37.0

Industry standards such as J-STD-005 and JIS Z 3284-1994 call for the use of viscosity measurement(s) as a quality assurance test method for solder paste. Almost all solder paste produced and sold use a viscosity range at a single shear rate as part of the pass-fail criteria for shipment and customer acceptance respectively. As had been reported many times, an estimated 80% of the defects associated with the surface mount technology process involve defects created during the printing process. Viscosity at a single shear rate could predict a fatal flaw in the printability of a solder paste sample. However, false positive single shear rate viscosity readings are not unknown.

Alpha Assembly Solutions

Videos: measure fail (6)

Temperature Sensor

Temperature Sensor

Videos

Camalot Prodigy Dispensing with new features NuJet and Dual Dynamic Head (DDH)

ITW EAE

CM Series Cleanliness Testers

CM Series Cleanliness Testers

Videos

Commonly referred to "Cleanliness Testing" as this test method has, for over 40 years, been acknowledged as an important Quality Assurance and Process Control tool in the manufacture of electronic circuit boards, components and assemblies. The Conta

Gen3 Systems

Career Center - Jobs: measure fail (3)

SMT Solder Specialist

Career Center | Clarksburg, Maryland | Engineering

Immediate opportunities for SMT Solder Specialist. Also have these positions open. All immediate opportunities: Assembler: Must have strong electro mechanical manufacturing skills. Experience with assembly of electro mechanical products in a high

Latitude Inc.

Production Supervisor (Bilingual)

Career Center | Lincolnshire, Illinois USA | Production

Summary: Supervises and coordinates activities of workers engaged in operating variety of machines to manufacture parts or products. Develops, recommends, and implements measures to improve production methods, equipment performance, and quality of p

Sentral Assemblies and Components

Career Center - Resumes: measure fail (2)

rozenblit1

Career Center | , Israel | Engineering,Maintenance,Technical Support

I was born on June , 1972 in Khmelnitsky city , Ukraine . I am male. From 1979 to 1987 I was studying at secondary school #7, having finished which I entered the Technical College of Khmelnitsky in specialty Machine Tools with Computer Numeric Contr

Manufacturing engineer & SMT process engineer

Career Center | Riyadh 11623, Philippines | Engineering,Maintenance,Production

PROFESSIONAL EXPERIENCE: Connected in the field of manufacturing/electronics industry experienced in the line, Through Hole and Surface Mount Technology, worked on various Fuji Machines Universal model, such as: CP 643E chip shooter QP 242E chip mou

Express Newsletter: measure fail (361)

Partner Websites: measure fail (66)

Seminars

ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/sonoscan/support/seminars

conventional electrical testing, lying in wait to cause your component to fail. Keep an eye out for more seminars to come to get acquainted with how C-SAM®

ASYMTEK Products | Nordson Electronics Solutions

LED Reflow Oven Conditions and Temperature Time Control-News-Reflow oven,SMT Reflow Soldering Oven-c

| http://etasmt.com/cc?ID=te_news_bulletin,19761&url=_print

. Before using the reflow oven, use a temperature measuring instrument to measure whether the temperature of each temperature zone of the reflow oven is consistent and uniform;   5


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