Industry Directory: moire (1)

Koh Young America, Inc.

Industry Directory | Consultant / Service Provider / Manufacturer / Other / Training Provider

Koh Young is the leading True3D™ measurement-based inspection solutions provider supported by its global offices to ensure close communication with a growing customer base to provide access to AI-powered process optimization tools

New SMT Equipment: moire (3)

Warpage/Coplanarity Measurement Lab Services

Warpage/Coplanarity Measurement Lab Services

New Equipment | Inspection

ZN Technologies (www.zntechnologies.com) is proud to offer warpage/coplanarity measurement services to customers worldwide.  Using the most advanced moire technique available (projection moire), ZN can measure BGA, PCB and IC warpage, even during ref

ZN Technologies

3D XPI 5000L - In-Line SPI System

3D XPI 5000L - In-Line SPI System

New Equipment | Inspection

Technical Innovation The first 10 bit image processing in its industry by on-the-fly vibrationless scan (High speed & high precision image acquisition) 4 times higher height measurement resolution than the existing Moire technology (The best

Synapse Imaging Co., Ltd.

Electronics Forum: moire (10)

Measuring PCB Stress during the assembly process

Electronics Forum | Wed Nov 28 08:42:19 EST 2001 | davef

Contact Cemal Basaran at the University at Buffalo Electronic Packaging Laboratory http://www.packaging.buffalo.edu. They develop Laser inspection technologies and use Moire Interferometry that may be able to do the things you want to do.

Open board SiP PCB warpage measurement

Electronics Forum | Fri Aug 30 11:20:17 EDT 2013 | jth

Hi, contact me at joe@zntechnologies.com. ZN Technologies offers warpage measurement at room temp and during reflow using the superior projection moire technique. Best regards, Joe

Used SMT Equipment: moire (7)

Mirtec MV-6e omni

Mirtec MV-6e omni

Used SMT Equipment | AOI / Automated Optical Inspection

Non-blind spot digital 8 projection moiré 3D inspection technology Inspection for diffuse reflection component, OCR, micro crack precisely by 8 phases coaxial color lighting Smallest componentinspection by ultra-high resolution camer

INSPECTION TECH

Mirtec MV-7 OMNI 3D AOI 2020

Mirtec MV-7 OMNI 3D AOI 2020

Used SMT Equipment | AOI / Automated Optical Inspection

Make: Mirtec Model: MV-7 OMNI Year: 2020 Type: 3D AOI Specifications: Fully Functional LIKE NEW - Mirtec Reconditioned June 2024 Exclusive 15MP/25MP CoaXPress Camera System OMNI-VISI

Parker SMT

Industry News: moire (53)

SMTA (Surface Mount Technology Association) all day Chapter Meeting at Textron Defense Systems on Tues., June 26, 2012:

Industry News | 2012-06-18 14:49:38.0

Reliability and Failure Analysis Seminar: Lessons Learned in Manufacturing. Presented by Universal Instruments Corporation’s Advanced Process Laboratory. Hosted by Textron Defense Systems, 201 Lowell St., Wilmington, MA

Surface Mount Technology Association (SMTA)

Akrometrix LLC to Demonstrate Real-Time Analysis, Array Generation (wafer partitioning), and 2D/3D Interface Analysis Software at productronica, U.S. Pavilion Hall A3, Booth 112/1

Industry News | 2015-10-22 16:56:59.0

Akrometrix LLC will exhibit in Hall A3, Booth 112/1 at the productronica International Trade Fair, scheduled to take place Nov. 10-13, 2015 at the Messe München exhibition center in Munich, Germany. Company representatives will exhibit Akrometric’s TherMoire’ AXP modular metrology platform which provides shadow moire’, digital fringe projection, and digital image correlation capabilities in one platform. Akrometrix also will demonstrate its new Real Time Analysis Software along with Array Generation Software (for thermal warpage measurement and partitioning of wafers) and Interface Analysis software that allows high level and in-depth review of the attachment interface between two surfaces that warp during microelectronics and electronic assembly production reflow processes.

Akrometrix

Technical Library: moire (1)

Projection Moiré vs. Shadow Moiré for Warpage Measurement and Failure Analysis of Advanced Packages

Technical Library | 2013-01-31 18:43:15.0

There are three key industry trends that are driving the need for temperature-dependent warpage measurement: the trend toward finer-pitch devices, the emergence of lead-free processing, and changes in device form factors. Warpage measurement has become a key measurement for analysis; prevention and prediction of interconnect defects and has been employed in failure analysis labs and production sites worldwide. First published in the 2012 IPC APEX EXPO technical conference proceedings

ZN Technologies

Videos: moire (7)

MIRTEC MS-11e 3D SPI Series Presentation

MIRTEC MS-11e 3D SPI Series Presentation

Videos

► Exclusive15MP / 25MP CoaXPress Camera System ► Dual Projection Shadow Free Moiré Technology ► Precision Compound Telecentric Camera Lens ► Automated Z-Height Calibration System ► Automated PCB Under Board Support System ► Precision PCB

MIRTEC Corp

MIRTEC MS-11 3D SPI Series Presentation

MIRTEC MS-11 3D SPI Series Presentation

Videos

► Exclusive 15MP CoaXPress Camera System ► Dual Projection Shadow Free Moiré Technology ► Precision Compound Telecentric Camera Lens ► Automated Z-Height Calibration System ► Automated PCB Under Board Support System ► Precision PCB Warpag

MIRTEC Corp

Express Newsletter: moire (1)

Partner Websites: moire (8)

LED Manufacturing Line 0.67um Accurancy SMT SPI Machine

| https://www.feedersupplier.com/sale-13240673-led-manufacturing-line-0-67um-accurancy-smt-spi-machine.html

.The operation system improves the result recognition and processing function according to the user level interface structure. 5. High precision programmable black and white moire fringe, the highest measuring accuracy 0.67um. 6


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