Industry Directory | Consultant / Service Provider
EDA-US, Inc. is a one stop shop for your design needs. From schematic capture to prototype development, EDA-US looks forward to working with you. For a quote or more information please email sales@eda-inc.us
USS is a provider/integrator of many machine vision error proofing systems. We work with Banner Engineering, Matrox, PPT Vision, Cognex, LMI, and IFM Effector systems. The sensors we use provide advanced, camera-based visual inspections at a price
New Equipment | Component Programming
Entry level desktop automation - the next step up from manual programming & duplication With a break-through in simplicity, the automated FLX family delivers blazing fast throughput in a desktop footprint. The FLX family eliminates human errors typi
Electronics Forum | Sat Sep 18 08:55:46 EDT 2010 | joetfree
Hi All, i have io head unit kv8-m4570 with error: limit error. if you have operation manual or suggestion, please help us Thanks
Electronics Forum | Wed May 02 22:14:21 EDT 2007 | DSD
The Philips Orion (Yamaha YV100) Head I/O Board is usually at fault as this tends to suffer trackwork problems with age due to the constant flexing of the board stressing the connectors on the board, thus breaking tracks within layers. You should not
Used SMT Equipment | In-Circuit Testers
Advantest D3186-10-70 / D3286-70 System Advantest D3186 Pulse Pattern Generator To accommodate transmission of large capacity information in the coming multimedia generation, ultra high speed digital telecommunications networks are being constr
Used SMT Equipment | In-Circuit Testers
Aeroflex IFR FB100A Aeroflex-IFR FB100A BER Test System The FB100A is a modular, expandable, high data rate BER (Bit Error Rate) test system. With operation from DC to 160 Mb/s, serial and/or parallel data interfacing and INSTALOK synchroniz
Industry News | 2013-01-02 16:01:34.0
A Convenienient and informative online tutorial about Design and Assembly Process Challenges for Bottom Terminations Components
Industry News | 2018-10-18 11:18:14.0
Making Readable Silkscreen Layouts for your Printed Circuit Board (PCB) Design
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Parts & Supplies | Pick and Place/Feeders
5322 310 11356 TOOLINGKIT 1 LASER 0.10 Service Parts - New 5322 310 11357 TOOLINGKIT 2 LASER 6,716.68 Service Parts - New 5322 310 32097 KIT 3-HEAD DRIVE ASSY SF 2,192.34 Service Parts - New 5322 310 32153
Parts & Supplies | SMT Equipment
5322 320 11133 CE: CABLE HARNESS HHK 1,449.92 Service Parts - New 5322 320 11207 HARNESS, ORION JUMPER 1 48.17 Service Parts - New 5322 320 11218 HARNESS 4-8 3,206.70 Service Parts - New 5322 320 11224 HARNESS, COMET STABLE 204.99 Service Parts -
Technical Library | 2020-03-04 23:53:17.0
Critical to maintaining quality control in high-throughput screening is the need for constant monitoring of liquid-dispensing fidelity. Traditional methods involve operator intervention with gravimetric analysis to monitor the gross accuracy of full plate dispenses, visual verification of contents, or dedicated weigh stations on screening platforms that introduce potential bottlenecks and increase the plate-processing cycle time. We present a unique solution using open-source hardware, software, and 3D printing to automate dispenser accuracy determination by providing real-time dispense weight measurements via a network-connected precision balance. This system uses an Arduino microcontroller to connect a precision balance to a local network. By integrating the precision balance as an Internet of Things (IoT) device, it gains the ability to provide real-time gravimetric summaries of dispensing, generate timely alerts when problems are detected, and capture historical dispensing data for future analysis. All collected data can then be accessed via a web interface for reviewing alerts and dispensing information in real time or remotely for timely intervention of dispense errors. The development of this system also leveraged 3D printing to rapidly prototype sensor brackets, mounting solutions, and component enclosures.
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
ML-2500S PCB Separator uses high speed rotation milling cutter to separate PCB array. Widely applied in digital, communication, lighting, etc. Which improved the defect on PCB separating caused by manual, V-cut, stamping, etc If you have any questi
FLX500™ is a compact, self-contained automated system for programming memory and microcontroller devices. At home on the desktop, in the lab, or on the production line, FLX500 drastically reduces quality problems inherent in manual gang programming
Career Center | EDEN PRAIRIE, Minnesota USA | Production
Logic PD collaborates with clients to help them launch products that accelerate growth and capture value in the Internet of Things (IoT). Logic PD helps at any stage in the product lifecycle by being the complete product innovation and product realiz
Low Force Placement Solution For Delicate and Low IO Flip Chip Assemblies News • Forums • SMT Equipment • Company Directory • Calendar • Career Center • Advertising • About • FREE Company Listing! Low Force Placement Solution For Delicate
SMTnet Express, November 27, 2019, Subscribers: 32,591, Companies: 10,932, Users: 25,355 Key Technology Choices For Optimal Massive IoT Devices Credits: Ericsson AB The latest cellular communication technologies LTE-M and NB-IoT enable
GPD Global | https://www.gpd-global.com/co_website/pdf/doc/Contour-Mapping-Calibration-User-Guide-221MAPDOC-5.pdf
Calibration Mapping reduces the errors in positioning/placement caused by mechanical imperfections. For precision of less than 0.003” (0.076 mm), mapping is required
ORION provides innovative solutions to our customers' EMI/RFI Shielding, Insulating, Screening and Sealing needs in a broad spectrum of manufacturing environments.
Manufacturer / Distributor / Consultant / Service Provider
1 Orion Park Drive
Ayer, MA USA
Phone: 978-772-6000
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