Industry Directory: pad stack analysis (9)

AI Technology, Inc. (AIT)

Industry Directory | Manufacturer

Manufactures and Provides: thermal interface materials (TIM) including insulated-metal-substrates, gap-filling compressible phase-change pads, thermal gels-greases,(EMI/RFI) mitigation conductive gaskets and other products.

PWB America, Inc. Complete PCB Solutions

Industry Directory | Consultant / Service Provider

PWB America, Inc. is a complete solution for prototype PCB layout design, fabrication and assembly. Providing quick turn

New SMT Equipment: pad stack analysis (109)

BGA X-Ray Inspection Services

BGA X-Ray Inspection Services

New Equipment | Assembly Services

BEST can provide you with analysis services for your BGAs using x-ray equipment. We rework thousands of BGAs and POPs every year, therefore, we have the expertise in BGA X-ray inspection. BEST can be your outsourced BGA x-ray inspection source for o

BEST Inc.

BGA Repair Service

BGA Repair Service

New Equipment | Rework & Repair Services

Your BEST Source For High Quality Industry-Leading BGA Repair Service BEST provides industry-leading solutions for Ball Grid Array BGA Repair Services and other grid array device reworks. Our engineers have developed better processes to make our BGA

BEST Inc.

Used SMT Equipment: pad stack analysis (54)

Agilent 89431A

Agilent 89431A

Used SMT Equipment | In-Circuit Testers

Agilent 89431A RF Section The 89431A RF Section is designed to couple with an Agilent 89410A Vector Signal Analyzer (VSA) to extend the coverage from 10 MHz to 2.65 GHz. When an Agilent 89410A VSA and an 89431A RF Section are combined, it

Test Equipment Connection

JDSU  JDSU FireBerd 8000-CFB8000-02-C2000-V6

JDSU JDSU FireBerd 8000-CFB8000-02-C2000-V6

Used SMT Equipment | In-Circuit Testers

JDSU FireBerd 8000-CFB8000-02-C2000-V6 Communications Analyzer JDSU FB8000 The FIREBERD 8000 combines the success of two highly successful test platforms - the FIREBERD 6000A and the TestPad. As a datacom analysis module for the TestPad, the por

Test Equipment Connection

Industry News: pad stack analysis (161)

Parts & Supplies: pad stack analysis (19)

Technical Library: pad stack analysis (12)

Influence of Plating Quality on Reliability of Microvias

Technical Library | 2016-05-12 16:29:40.0

Advances in miniaturized electronic devices have led to the evolution of microvias in high density interconnect (HDI) circuit boards from single-level to stacked structures that intersect multiple HDI layers. Stacked microvias are usually filled with electroplated copper. Challenges for fabricating reliable microvias include creating strong interface between the base of the microvia and the target pad, and generating no voids in the electrodeposited copper structures. Interface delamination is the most common microvia failure due to inferior quality of electroless copper, while microvia fatigue life can be reduced by over 90% as a result of large voids, according to the authors’ finite element analysis and fatigue life prediction. This paper addresses the influence of voids on reliability of microvias, as well as the interface delamination issue.

CALCE Center for Advanced Life Cycle Engineering

Reliability and Failure Mechanisms of Laminate Substrates in a Pb-free World

Technical Library | 2009-04-30 18:06:24.0

This presentation surveys the most significant via and via-related laminate failure mechanisms from past to present using data from current induced thermal cycling (CITC) testing, failure analysis, and other sources. The relative life and failure modes of thru vias, buried vias, and microvias (stacked vs. non-stacked) are compared, along with the affect of structure, materials, and peak temperatures on the above. The origin of via-induced laminate failures such as "eyebrow cracks" and Pb free related internal delamination is also explored.

i3 Electronics

Videos: pad stack analysis (17)

BGA X-Ray Inspection

BGA X-Ray Inspection

Videos

BEST's BGA x-ray inspection capabilities are shown as one of the x-ray techs "drives around" the BGA after BGA rework. During BGA x-ray inspection the first view is a macro one followed by zooming in and examing each area closely. Look at our BGA X-

BEST Inc.

BGA Rework Service and Repair Services By BEST, Inc.

BGA Rework Service and Repair Services By BEST, Inc.

Videos

This video describes the BEST BGA rework and BGA rework services capabilities. What is described in this movie are the people, processes and tools unique to BEST and how that impacts its customers. The advanced equipment set including multiple refl

BEST Inc.

Events Calendar: pad stack analysis (2)

Europe Chapter Webinar: Tombstoning Components during Reflow Soldering - Causes & Cures

Events Calendar | Sun Apr 11 18:30:00 UTC 2021 - Sun Apr 11 18:30:00 UTC 2021 | ,

Europe Chapter Webinar: Tombstoning Components during Reflow Soldering - Causes & Cures

Surface Mount Technology Association (SMTA)

San Diego Chapter In-Person Event: IPC J-STD-001 Compliant Solder Pattern Calculations for DFA

Events Calendar | Sun Jun 09 18:30:00 UTC 2024 - Sun Jun 09 18:30:00 UTC 2024 | Carlsbad, California USA

San Diego Chapter In-Person Event: IPC J-STD-001 Compliant Solder Pattern Calculations for DFA

Surface Mount Technology Association (SMTA)

Career Center - Jobs: pad stack analysis (3)

Senior Hardware Design Engineer

Career Center | Fremont, California USA | Engineering

Job Description: • Has full ownership of HW design and release including HW specification creation, schematic generation, PCB layout, board bring up, and design verification. • Complete PCB design schematic using Orcad capture. • Complete HW desig

Unigen Corporation

Senior PCB Layout Designer

Career Center | Fremont, California USA | Engineering

Interprets electrical design requirements and uses Allegro design tool to create original PCB layouts, detailed fab drawings, schematics, and other design files. Work with HW design engineer to make sure PCB layout meet PCB design requirements.

Unigen Corporation

Express Newsletter: pad stack analysis (572)

Partner Websites: pad stack analysis (1285)


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