STI is the leading manufactore of 2D/3D Automated visual defect inspection equipment. We offer the All-In-One soulution for inspecting Active Die, Probe Mark, Ink Dot & 2D/3D Bumped Wafers (including 300mm). .
Welcome to the next generation in PWB test solutions. We combine an exceptional team of technology and applications experts with HIOKI's industry-leading systems to enhance your reliability and to speed up your product development process.
New Equipment | ESD Control Supplies
Humidity and temperature affect resistivity so they must be tested. The RT-1000 tests resistivity, humidity, and temperature of all conductive, antistatic, and static dissipative surfaces for electrical resistivity/resistance according to the EOS/ESD
New Equipment | Test Equipment
Designed for panelization FPCB inspection, improve the original process, router the panelization FPCB, than inspect one by one. With Pallet Tester and special use platform, you can place the un-panelization FPCB and do the inspection at load / unload
Used SMT Equipment | Soldering - Reflow
Vintage: 2006 Details: • 7 zone, 1 cooling zone • Rail & Mesh • No center rail support • Auto chain oiler (not enabled) • Controller: Intellimax 2 • Software rev: Wiscon 6.0 • Has air cooling
Used SMT Equipment | In-Circuit Testers
Becoming available soon; SPEA 4040 Flying Probe Tester 208 3 phase power L tot R Board Flow SMEMA Compliant CE Marked Leonardo Suite; Board Learn, Express and Advanced FBO: Origin Contact: Assured Technical Service LLC Minneapolis, M
Industry News | 2003-06-19 08:13:11.0
The new heads are capable of reaching an acceleration of greater than 20g.
Industry News | 2016-04-07 16:38:39.0
Experiencing IPC APEX EXPO’s legendary combination of education, technology, networking and the largest collection of industry suppliers, 4,048 attendees from 56 countries capitalized on all the forward thinking the show had to offer. Four-hundred and thirty four exhibitors displaying hundreds of products on 139,300 net square feet of show floor space saw three days of qualified leads and sales. IPC APEX EXPO 2016 attracted 8,772 total visitors including attendees and exhibitor personnel.
Ultra-High speed measuring Measuring rate up to 40 steps per second helps reduce tact times and can actually be used in fully automated production lines averting a bottleneck. This is indeed a unique strength of Hioki’s flying probe testers. Fine pi
“The Ultimate Probing Machine”. Ultra Fast full Function Patented Double-sided, Closed Loop 22-probe System, All probes are Analog, Digital, Boundary Scan, and Vectorless Test enabled. Use it In-Line or manual operation with AOI capabilities. The
Career Center | , Tamilnadu India | Engineering
Mobile: 9940127531 email: sooree_k@yahoo.com , sooree.k@gmail.com Engineering – Process and Product quality (Semiconductors and Electronics Manufacturing) Professional Experience: Total of 9 year Flextronics Technologies (I) Pvt LTD : Assistant
Career Center | Norfolk, Virginia USA | Engineering,Maintenance,Management,Production,Purchasing,Quality Control,Research and Development,Technical Support
Jay Selter Test Engineer / Technician; Formal Education: Schools and Courses completed. BROOKLYN TECHNICAL HIGH SCHOOL, NEW YORK: Electrical engineering design (two year major): Meter design and construction; Transformer design and materials; Moto
GPD Global | https://www.gpd-global.com/co_website/pdf/doc/FLOware-Import-Export-Data-Reference-Guide-22100024R.pdf
+ dated 05/18/18 SUBTYPE Expanded definition for Probe subop (used by Operate operation). Version 2.9 dated 11/03/14 MOUNTS Added NCM Close Time/nClose Time, NCM Open Time/nOpen Time
