Industry Directory: scanning electron microsope (27)

ScanCAD International, Inc.

Industry Directory | Consultant / Service Provider / Manufacturer / Other

Global provider of Legacy PCB Re-Engineering Systems & Process Control Tools since 1990.

GOEPEL Electronic

Industry Directory | Manufacturer

Vendor of systems for Automated Optical Inspection (AOI), 3D X-Ray Inspection (AXI)and 3D solder paste inspection (SPI). The company's inline and stand-alone AOI systems won several "Best in Test Awards"

New SMT Equipment: scanning electron microsope (106)

IN-CIRCUIT TESTER PMP-818S

IN-CIRCUIT TESTER PMP-818S

New Equipment | Test Equipment

IN-CIRCUIT TESTER PMP-818S IN-CIRCUIT TESTER PMP-818S What does an in-circuit tester do? In-circuit test performs a “schematic verification” by testing individual components of a printed circuit board (PCBA) one at a time by comparison against a s

Qinyi Electronics Co.,Ltd

PTI-500 First Article Inspection Tester

PTI-500 First Article Inspection Tester

New Equipment | Inspection

PTI-500 First Article Inspection Tester 版本号:PTI500V2.0 、 PRODUCT FUNCTIONALITIES ✦ADVANCED SOFTWARE, USER FRIENDLY INTERATIVE OPERATION MINIMALIST DESIGN ✦INTUITIVE VIEW OF TEST RESULT The test result is plotted on individual component which can be

Qinyi Electronics Co.,Ltd

Electronics Forum: scanning electron microsope (450)

siplace s-15 scanning unit DP

Electronics Forum | Thu Feb 26 09:27:15 EST 2004 | smtprof

How i can adjust sensitivity of scanning unit DP-Axis amplifier ?

siplace s-15 scanning unit DP

Electronics Forum | Fri Feb 27 10:12:36 EST 2004 | stefwitt

The front plate of the S15 head gives you access to the signal amplifier boards. You'll find 4 potentiometers adjusting the voltage and the symmetry of track A and B. A digital scope turned to X+Y provides an image of a circle, which is been adjusted

Used SMT Equipment: scanning electron microsope (8)

Hitachi SEM

Hitachi SEM

Used SMT Equipment | Semiconductor & Solar

HITACHI S-3000-N Scanning Electron Microscope (SEM)   Not sure of vintage!   Full specifications upon request.   https://www.karenmadison.com/hitachi-s-3000-n-scanning-electron-microscope-sem/

karenmadison.com

SPEA FP 4040 HI-LINE SERIES 5 Flying Probe Tester (2004)

SPEA FP 4040 HI-LINE SERIES 5 Flying Probe Tester (2004)

Used SMT Equipment | In-Circuit Testers

SPEA 4040 Flying Probe with Boundry Scan Model: FP 4040 HI-LINE SERIES 5 Flying Probe Tester Year: 2004 S/N: SWE537FF 4040 Hi Line; high speed high accuracy (1) DRIV-10 V/I Generator; Precision Driver, 4Q, +/-10V, +/- 1A (1) Boost-80 V/I Gene

Tekmart International Inc.

Industry News: scanning electron microsope (580)

Low-Cost UNIX- and PC-Based Boundary-Scan Upgrade for Agilent 3070 In-Circuit Testers

Industry News | 2003-04-03 08:51:07.0

Symphony 3070TM Package from JTAG Technologies for Testing and In-System Flash / PLD Programming

SMTnet

SMTA, Donald Stevens Congress Center, Rosement, IL, September 27-28, Booth # 136

Industry News | 2016-08-13 19:54:46.0

JTAG Technologies return to SMTA in 2016 to premiere several new hardware products for PCB testing and In-System [Device] Programming.

Surface Mount Technology Association (SMTA)

Parts & Supplies: scanning electron microsope (2)

Saki Saki 3D SPI machine

Parts & Supplies | Soldering Equipment/Fluxes

3D Solder Paste Inspection Machine  Features : Easy to use by fully motorize X-Y scan mechanism. Easy to program by Gerber image navigator Easy to repeat the same job by loading the saved program User-friendly color image live view operation Ea

Goodluck Electronic Equipment Co.,Ltd

Vitronics Industrial circuit boardrepair

Vitronics Industrial circuit boardrepair

Parts & Supplies | Repair/Rework

Repair parts include: CPU circuit board repair and maintenance of the I / O board, servo circuit board repair, the image processing circuit board repair, industrial CCD camera repair, frequency converter repair, PLC repair, touch screen repair, laser

Goodluck Electronic Equipment Co., Ltd

Technical Library: scanning electron microsope (15)

Effect of Reflow Profile on SnPb and SnAgCu Solder Joint Shear Force

Technical Library | 2023-01-17 17:27:13.0

Reflow profile has significant impact on solder joint performance because it influences wetting and microstructure of the solder joint. The degree of wetting, the microstructure (in particular the intermetallic layer), and the inherent strength of the solder all factor into the reliability of the solder joint. This paper presents experimental results on the effect of reflow profile on both 63%Sn 37%Pb (SnPb) and 96.5%Sn 3.0%Ag 0.5%Cu (SAC 305) solder joint shear force. Specifically, the effect of the reflow peak temperature and time above solder liquidus temperature are studied. Nine reflow profiles for SAC 305 and nine reflow profiles for SnPb have been developed with three levels of peak temperature (230 o C, 240 o C, and 250 o C for SAC 305; and 195 o C, 205 o C, and 215 o C for SnPb) and three levels of time above solder liquidus temperature (30 sec., 60 sec., and 90 sec.). The shear force data of four different sizes of chip resistors (1206, 0805, 0603, and 0402) are compared across the different profiles. The shear force of the resistors is measured at time 0 (right after assembly). The fracture surfaces have been studied using a scanning electron microscopy (SEM) with energy dispersive spectroscopy (EDS)

Heller Industries Inc.

Nondestructive Inspection of Underfill Layers Stacked up in Ceramics-Organics-Ceramics Packages with Scanning Acoustic Tomography (SAT)

Technical Library | 2017-06-15 00:44:19.0

Ceramics packages are being used in the electronics industry to operate the devices in harsh environments. In this paper we report a study on acoustic imaging technology for nondestructively inspecting underfill layers connecting organic interposers sandwiched between two ceramics substrates.First, we inspected the samples with transmission mode of scanning acoustic tomography (SAT) system, an inspection routine usually employed in assembly lines because of its simpler interpretation criteria: flawed region blocks the acoustic wave and appears darker. In this multilayer sample, this approach does not offer the crucial information at which layer of underfill has flaws. To resolve this issue, we use C-Mode Scanning in reflection mode to image layer by layer utilizing ultrasound frequencies from 15MHz to 120MHz. Although the sample is thick and contains at least 5 internal material interfaces, we are able to identify defective underfill layer interfaces.

Flex (Flextronics International)

Videos: scanning electron microsope (45)

Intelligent Component Storage System for smt

Intelligent Component Storage System for smt

Videos

Smart Electronic Shelves Fixed electronic shelf instructions ※ Multi-color LED (set according to the actual needs of customers), support multiple sets of work orders at the same time to prepare materials for delivery ※ double-sided access material ※

Qinyi Electronics Co.,Ltd

ACI Technologies Inc. - Commercial Services - Engineering, Manufacturing, Analytical and Electronics Manufacturing Training (IPC Certification Training and Custom Electronics Manufacturing Courses)

ACI Technologies Inc. - Commercial Services - Engineering, Manufacturing, Analytical and Electronics Manufacturing Training (IPC Certification Training and Custom Electronics Manufacturing Courses)

Videos

ACI Technologies Inc. (ACI) is a scientific research corporation dedicated to the advancement of electronics manufacturing processes and materials for The Department of Defense and industry. This video provides an overview of our commercial service

ACI Technologies, Inc.

Training Courses: scanning electron microsope (3)

Failure Analysis and Reliability Testing in Electronics Manufacturing

Training Courses | | | PCB Inspection Courses

The PCB inspection courses focus on improving PCB yield and reliability through validation and detection of defects on electronics assemblies.

ACI Technologies, Inc.

Counterfeit Component Training Course

Training Courses | | | PCB Inspection Courses

The PCB inspection courses focus on improving PCB yield and reliability through validation and detection of defects on electronics assemblies.

ACI Technologies, Inc.

Career Center - Jobs: scanning electron microsope (3)

Test Engineer

Career Center | Gaithersburg, Maryland USA | Engineering,Production

Test Engineer Design hardware and software solutions required to test data communications products in a low-medium volume, high-mix production test environment. Design and build test fixtures to support these solutions. Support Production Test d

Patton Electronics Company

President

Career Center | Carleton, Michigan USA | Engineering,Sales/Marketing

Proof Of Design, a leading electronics and electromechanical engineering consultancy, needs a very knowledgeable, highly experienced test engineer to join our team for pending contracts. Must have JTAG/Boundary scan experience and the ability to trav

Proof Of Design

Career Center - Resumes: scanning electron microsope (10)

SMT & OTHER ENGG. POST

Career Center | GURGAON, India | Engineering,Quality Control,Research and Development

NO

Machine Operator Looking for Work

Career Center | Williamsburg, Kentucky USA | Engineering,Production,Quality Control

SKILLS My computer skills are fluent with experience in Microsoft Word, Internet, WordPerfect and Microsoft Works. I have an extensive electronics background. I can type 40 wpm. I am multi-skilled with a vast knowledge in electronics and over 10 y

Express Newsletter: scanning electron microsope (1104)

SMTnet Express - July 26, 2018

SMTnet Express, July 26, 2018, Subscribers:31,208, Companies: 11,001, Users: 24,976 Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of Printed Circuit Board Assembly Jun Balangue; Keysight Technologies This paper

Partner Websites: scanning electron microsope (16)

Effects of Cl2, NO2, Rh and Temperature on Accelerated Silver and Copper Corrosion in Mixed Flowing

Surface Mount Technology Association (SMTA) | https://www.smta.org/knowledge/proceedings_abstract.cfm?PROC_ID=5027

. Cathodic reduction was used to quantitatively determine Ag and Cu corrosion products. Scanning electron microscopy was applied to compare surface morphologies of metal films under various test conditions

Surface Mount Technology Association (SMTA)

Microsoft Word - pan_APEX06.doc

Heller Industries Inc. | https://hellerindustries.com/wp-content/uploads/2018/07/pan_APEX06.pdf

). The fracture surfaces have been studied using a scanning electron microscopy (SEM) with energy dispersive spectroscopy (EDS). Introduction The increasing awareness of health risk associated with lead (Pb

Heller Industries Inc.


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