Industry Directory: scanning electron microsope (27)

ScanCAD International, Inc.

ScanCAD International, Inc.

Industry Directory | Other / Consultant / Service Provider / Manufacturer

ScanCAD is an industry leader in inspection, measurement, process control and reverse engineering. Our solutions support OEM's, manufacturers, stencil fabricators, repair depots, and others in optimizing quality and yield.

Goepel Electronics Ltd

Industry Directory | Consultant / Service Provider / Manufacturer

Manufacturer of Inspection systems AOI, AXI, THT, SPI Manufacturer and supplier of Embedded Access systems, JTAG, Boundary Scan

New SMT Equipment: scanning electron microsope (726)

Reverse Engineering Services

Reverse Engineering Services

New Equipment | Rework & Repair Services

ScanCAD provides comprehensive electronics reverse engineering services, transforming physical printed circuit boards (PCBs), ceramic substrates, and hybrids into complete manufacturing data packages. Utilizing advanced, high-resolution scanning syst

ScanCAD International, Inc.

Intelligent Component Storage System for smt

Intelligent Component Storage System for smt

New Equipment | SMD Reel Storage

Smart Electronic Shelves Fixed electronic shelf instructions ※ Multi-color LED (set according to the actual needs of customers), support multiple sets of work orders at the same time to prepare materials for delivery ※ double-sided access material ※

QYSMT SOLUTION USA LLC / Qinyi Electronics Co.,Ltd

Used SMT Equipment: scanning electron microsope (8)

Hitachi SEM

Hitachi SEM

Used SMT Equipment | Semiconductor & Solar

HITACHI S-3000-N Scanning Electron Microscope (SEM)   Not sure of vintage!   Full specifications upon request.   https://www.karenmadison.com/hitachi-s-3000-n-scanning-electron-microscope-sem/

karenmadison.com

SPEA FP 4040 HI-LINE SERIES 5 Flying Probe Tester (2004)

SPEA FP 4040 HI-LINE SERIES 5 Flying Probe Tester (2004)

Used SMT Equipment | In-Circuit Testers

SPEA 4040 Flying Probe with Boundry Scan Model: FP 4040 HI-LINE SERIES 5 Flying Probe Tester Year: 2004 S/N: SWE537FF 4040 Hi Line; high speed high accuracy (1) DRIV-10 V/I Generator; Precision Driver, 4Q, +/-10V, +/- 1A (1) Boost-80 V/I Gene

Tekmart International Inc.

Industry News: scanning electron microsope (685)

Low-Cost UNIX- and PC-Based Boundary-Scan Upgrade for Agilent 3070 In-Circuit Testers

Industry News | 2003-04-03 08:51:07.0

Symphony 3070TM Package from JTAG Technologies for Testing and In-System Flash / PLD Programming

SMTnet

ScanCAD - ECT Strategic Partnership Announced

Industry News | 2009-10-16 16:26:33.0

Everett Charles Technologies, (ECT), a Dover Company and a leader in the development of advanced technology board test products, announced that ECT has finalized a strategic partnership with ScanCAD International of Littleton, CO, USA, a global supplier of process management tools. This partnership provides for ScanCAD International to exclusively distribute and support the ProWorks process management work instruction software family of products globally within the electronics industry.

ScanCAD International, Inc.

Parts & Supplies: scanning electron microsope (7)

Technical Library: scanning electron microsope (15)

Effect of Reflow Profile on SnPb and SnAgCu Solder Joint Shear Force

Technical Library | 2023-01-17 17:27:13.0

Reflow profile has significant impact on solder joint performance because it influences wetting and microstructure of the solder joint. The degree of wetting, the microstructure (in particular the intermetallic layer), and the inherent strength of the solder all factor into the reliability of the solder joint. This paper presents experimental results on the effect of reflow profile on both 63%Sn 37%Pb (SnPb) and 96.5%Sn 3.0%Ag 0.5%Cu (SAC 305) solder joint shear force. Specifically, the effect of the reflow peak temperature and time above solder liquidus temperature are studied. Nine reflow profiles for SAC 305 and nine reflow profiles for SnPb have been developed with three levels of peak temperature (230 o C, 240 o C, and 250 o C for SAC 305; and 195 o C, 205 o C, and 215 o C for SnPb) and three levels of time above solder liquidus temperature (30 sec., 60 sec., and 90 sec.). The shear force data of four different sizes of chip resistors (1206, 0805, 0603, and 0402) are compared across the different profiles. The shear force of the resistors is measured at time 0 (right after assembly). The fracture surfaces have been studied using a scanning electron microscopy (SEM) with energy dispersive spectroscopy (EDS)

Heller Industries Inc.

The Long-term Shaping of the JTAG/Boundary-scan Standards

Technical Library | 2015-05-11 21:27:52.0

Originating from the last millenium, almost three decades ago, the introduction of surface mount packaging triggered a wave of changes throughout many aspects of electronics production. A small number of talented, innovative test engineers from various big players of the industry started to attend meetings to discuss the impact of that change of technology on their future test concepts for modern assemblies. The Joint Test Action Group was born.

JTAG Technologies B. V.

Videos: scanning electron microsope (60)

Intelligent Component Storage System for smt

Intelligent Component Storage System for smt

Videos

Smart Electronic Shelves Fixed electronic shelf instructions ※ Multi-color LED (set according to the actual needs of customers), support multiple sets of work orders at the same time to prepare materials for delivery ※ double-sided access material ※

QYSMT SOLUTION USA LLC / Qinyi Electronics Co.,Ltd

Intelligent SMD Component Storage System

Intelligent SMD Component Storage System

Videos

Intelligent SMD Component Storage System Feature •Management is simple ▶Reduce manpower and improve efficiency ▶System control FIFO, eliminate human interference ▶Visual management, lights prompt ingredients, reduce staff Operation requirements •Pro

QYSMT SOLUTION USA LLC / Qinyi Electronics Co.,Ltd

Training Courses: scanning electron microsope (1)

Career Center - Jobs: scanning electron microsope (3)

Test Engineer - SMT, ICT, Functional

Career Center | , | Engineering

We're actively searching for a Senior ICT/Functional Test Engineer with experience in HP3070's, Boundary Scan, Functional design and sustaining that has the ability to become a Test Engineering Manager within 12-18 months.� This position will offer y

DCSI Consultants

President

Career Center | Carleton, Michigan USA | Engineering,Sales/Marketing

Proof Of Design, a leading electronics and electromechanical engineering consultancy, needs a very knowledgeable, highly experienced test engineer to join our team for pending contracts. Must have JTAG/Boundary scan experience and the ability to trav

Proof Of Design

Career Center - Resumes: scanning electron microsope (6)

BankeemChheda-Resume

Career Center | Rochester, New York USA | Engineering

I have done my undergraduate studies in Mechanical Engineering. I am pursuing my Master's Program in Electronics Packaging. I am currently working as a Research Assistant for RIT-CEMA (Center for Electronics Manufacturing and Assembly). My research

Reliability, Failure Analysis and Six Sigma

Career Center | Coral Springs, Florida USA | Engineering,Management,Production,Quality Control,Research and Development,Technical Support

�Hands on experience with various failure analysis and materials characterization techniques including scanning and transmission electron microscopy, energy dispersive X-ray analysis, mechanical testing with Instron and MTS machines �Working knowledg

Express Newsletter: scanning electron microsope (1282)

SMTnet Express - July 26, 2018

SMTnet Express, July 26, 2018, Subscribers:31,208, Companies: 11,001, Users: 24,976 Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of Printed Circuit Board Assembly Jun Balangue; Keysight Technologies This paper

Partner Websites: scanning electron microsope (16)

Effects of Cl2, NO2, Rh and Temperature on Accelerated Silver and Copper Corrosion in Mixed Flowing

Surface Mount Technology Association (SMTA) | https://www.smta.org/knowledge/proceedings_abstract.cfm?PROC_ID=5027

. Cathodic reduction was used to quantitatively determine Ag and Cu corrosion products. Scanning electron microscopy was applied to compare surface morphologies of metal films under various test conditions

Surface Mount Technology Association (SMTA)

Microsoft Word - pan_APEX06.doc

Heller Industries Inc. | https://hellerindustries.com/wp-content/uploads/2018/07/pan_APEX06.pdf

). The fracture surfaces have been studied using a scanning electron microscopy (SEM) with energy dispersive spectroscopy (EDS). Introduction The increasing awareness of health risk associated with lead (Pb

Heller Industries Inc.


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