New Equipment | Test Equipment
NEW Seica Pilot S20 and LX Heads are available on our website! Call for details and pricing
New Equipment | Test Equipment
Tebo-ICT is a kind of very professional ICT and ATE fixture software. Chinese interface, designed in humanity, compatible with Win98/2000/NT/XP/7/10 system, which is easy to operate and train. It can cope with all kinds of GERBER and buried via, posi
Electronics Forum | Wed Jun 29 16:30:48 EDT 2016 | proy
We have been studying and learing how to work with an older Seica Pilot (S20 software) flying probe tester. A third party company has been very helpful but they are not that familiar with the S20 software. Looking for someone with knowledge of the S2
Electronics Forum | Fri Sep 12 08:32:44 EDT 2008 | pjc
Its actually a Seica machine. GenRad just labeled it. Teradyne/GenRad no longer supports the system. Go directly to Seica, http://www.seica.com , they are an Italian company with offices around the world. There is one in Nashua NH. Some 3rd party o
Used SMT Equipment | In-Circuit Testers
FOR SALE: Make: Seica Model: Pilot S20 Refurbished in 2008 Windows PC Version 3.16 SW - 1 Scanner Board (SCAFP)- 12 Analog Channels – 4 Mobile Test Heads w/Probes – “Active Probe” Circuitry for all Mobile Test
Used SMT Equipment | Visual Inspection
Make: Pilot LX Vintage: 2006 Operating System: Windows Software Version: S20 Win 3.16.12 Availability: Immediate Condition: The system is fully operational and passes all system diagnostics.
Industry News | 2015-02-17 10:54:42.0
Seica will be exhibiting our new line of flying prober, the Pilot 4D line which will be represented at the show by the Pilot 4DV8 and Pilot FX. The Pilot 4D line represents the latest in technology in flying probe testing for both ICT, functional testing and data regeneration applications.
Industry News | 2014-12-29 06:28:26.0
Seica Inc. will be exhibiting our new line of flying prober, the Pilot 4D line which will be represented at the show by the Pilot 4DV8 and Pilot FX. The Pilot 4D line represents the latest in technology in flying probe testing for both ICT, functional testing and data regeneration applications.
